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N9417S 7500 Atomic Force Microscope (AFM)

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Discontinued / Currently Supported

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HIGHLIGHTS

Instrument features

Atomic-resolution imaging with closed-loop 90μm scanner
Exceptional environmental and temperature control
Standard nose cone supports expanded set of imaging modes
Superior scanning in fluids, gases, and ambient conditions
Unprecedented electrochemistry (EC) capabilities

Research resources

The Keysight 7500 AFM/SPM establishes new performance, versatility, and ease-of-use benchmarks for nanoscale measurement, characterization, and manipulation. The 90 um AFM closed scanner achieves outstanding low noise performance, enabling atomic-resolution imaging. The 7500 is ideal for materials science, life science, polymer science, electrochemistry, electrical characterization, and nanolithography applications.

The 7500 offers excellent closed-loop resolution, leading environmental and temperature control, and an wide- range of electrochemistry capabilities. The 7500 scanner’s standard nose cone permits many AFM techniques, including Keysight’s MAC Mode. Easy-to-load nose cones for additional AFM techniques can be interchanged quickly and conveniently. Single-pass nanoscale electrical characterization is achievable using MAC Mode III. For ultimate experimental control, the 7500 automatically identifies connected accessories via hot plug technology.

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N9417S 7500 Atomic Force Microscope (AFM)

HIGHLIGHTS

Instrument features

Research resources