Highlights

Designed for Phase Noise Test System Power Users 

The Keysight N5511A phase noise test system (PNTS) lets you measure at the limits of physics with readings down to kT (-177 dBm/Hz). The N5511A PNTS is a replacement for the gold-standard Keysight E5500 phase noise measurement system and is designed to meet the needs of phase noise power users.

  • Designed for phase noise power users at the high end of the market
  • Flexible architecture lets you integrate exceptional reference sources — yours or ours — and confidently solve specific challenges faster
  • Multi-segment hardware cross-correlation in field programmable gate array (FPGA)
  • Absolute and residual phase noise using the phase detector (quadrature) method and cross-spectral averaging (cross­correlation) for sensitivity down to the kT thermal phase noise floor (-177 dBm/Hz)

Most Flexible Measurement Solution

The N5511A PNTS modular instrument architecture takes advantage of standalone instrumentation for superior frequency offset range, broadest capability, best sensitivity, and excellent overall value for phase noise measurements. It can accept any reference source that is electronically frequency tunable — so you can get better performance as newer and higher performance signal generators come to market.

KEY SPECIFICATIONS

Measurement Capabilities
Absolute or residual phase noise, AM noise, CW or pulsed carrier, low-level spurious signals. Single or dual-channel configurations available.
Frequency Range
50 kHz to 3.0, 26.5 or 40 GHz, or to 110 GHz with external mixers
Offset Frequency Range
0.01 Hz to 160 MHz. Wider offsets available using an external signal analyzer
Phase Noise Sensitivity
-200 dBc/Hz (with +23 dBm input signal)
Reference Source
Requires one or two external reference sources, depending on configuration (i.e., single- or dual- channel)
Transient/RF Transient Measurements
No
Measurement Capabilities
Frequency Range
Offset Frequency Range
Phase Noise Sensitivity
Reference Source
Transient/RF Transient Measurements
Absolute or residual phase noise, AM noise, CW or pulsed carrier, low-level spurious signals. Single or dual-channel configurations available.
50 kHz to 3.0, 26.5 or 40 GHz, or to 110 GHz with external mixers
0.01 Hz to 160 MHz. Wider offsets available using an external signal analyzer
-200 dBc/Hz (with +23 dBm input signal)
Requires one or two external reference sources, depending on configuration (i.e., single- or dual- channel)
No
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Additional Information:
Flexible configuration and instrumentation
DC Sources for Oscillator Characterization:
No
Frequency Range:
50 kHz to 3.0, 26.5 or 40 GHz, or to 110 GHz with external mixers
Measurement Capabilities:
Absolute or residual phase noise, AM noise, CW or pulsed carrier, low-level spurious signals. Single or dual-channel configurations available.
Offset Frequency Range:
0.01 Hz to 160 MHz. Wider offsets available using an external signal analyzer
Phase Noise Sensitivity:
-200 dBc/Hz (with +23 dBm input signal)
Reference Source:
Requires one or two external reference sources, depending on configuration (i.e., single- or dual- channel)
Transient/RF Transient Measurements:
No

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