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Highlights

  • The New Standard Test Wizard increases custom test cycle productivity
  • Channel Loss Compensation for more accurate TDR waveforms
  • Hardware support for newest vector network analyzers

The new Physical Layer Test System (PLTS) 2023 is the industry standard for signal integrity measurements and data post-processing of high-speed interconnects, such as cables, backplanes, PCBs, and connectors. Many signal integrity laboratories around the world have benefited from the power of PLTS in the R and D prototype test phase. PLTS 2023 has now migrated to a powerful 64-bit application unleashing high port count s-parameter measurements. Today’s 800G internet infrastructure demands multi-port channel analysis to mitigate crosstalk issues that can cause bit errors and the new 64-bit PLTS application enables deeper memory for those large data files of 16-port and 32-port s-parameter measurements.

PLTS N19305B extends the N19301B base product to perform advanced calibration techniques such as Automatic Fixture Removal (AFR).

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N19305B PLTS Advanced Calibration

  • PLTS N19305B extends the N19301B base product to perform advanced calibration techniques such as Automatic Fixture Removal (AFR)

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Featured Resources for N19305B PLTS Advanced Calibration

Application Notes 2023.01.05

Signal Integrity Analysis Series Part 1: Single-Port TDR, TDR/TDT, and 2-Port TDR

Signal Integrity Analysis Series Part 1: Single-Port TDR, TDR/TDT, and 2-Port TDR

Part 1 of a 2-part series explaining techniques in signal integrity analysis for those who use single-port TDR, TDR/TDT and 2-port TDR. Learn more.

2023.01.05

Technical Overviews 2023.01.24

Physical Layer Test System (PLTS) 2023

Physical Layer Test System (PLTS) 2023

Physical Layer Test System (PLTS) 2023 Software

2023.01.24

Application Notes 2017.11.30

Signal Integrity Analysis Series 4-Port TDR/VNA/PLTS

Signal Integrity Analysis Series 4-Port TDR/VNA/PLTS

Part 2 of signal integrity analysis and 4-port techniques using TDR and VNA to help digital designers get the design right the first time. Learn more.

2017.11.30

Application Notes 2014.07.30

Signal Integrity Analysis Part 3: De-Embedding

Signal Integrity Analysis Part 3: De-Embedding

This paper explains different de-embedding techniques, why de-embedding is necessary, and shows how to minimize fixture effects for best results. Learn more.

2014.07.30

Application Notes 2023.04.20

How to Ensure Interoperability and Compliance of USB Type-C Cables and Connectors

How to Ensure Interoperability and Compliance of USB Type-C Cables and Connectors

This application note covers various aspects of the challenges and solutions for the USB Type-C cables and connectors test, including new USB4 and USB4 Version 2.0 compliance test requirements.

2023.04.20

White Papers 2019.06.19

Differential Device Modeling Advanced Measurements

Differential Device Modeling Advanced Measurements

Learn to make advanced measurements and how to model differential devices. Correctly measure non-linear differential circuits using single-ended techniques.

2019.06.19

Article Reprints 2016.03.30

Signal Integrity Tips and Techniques Using TDR, VNA and Modeling

Signal Integrity Tips and Techniques Using TDR, VNA and Modeling

Time and frequency domain analyses for simulation and measurements provide quick solutions for characterizing signal losses and identifying elements that control performance.

2016.03.30

Brochures 2018.03.07

Lightwave Catalog: Test & Measurement Networks and Data Centers

Lightwave Catalog: Test & Measurement Networks and Data Centers

The catalog for high-performance optical T&M solutions provides information on test applications and test equipment for core fiber networks and data centers.

2018.03.07

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