Highlights

  • Max node count: 2592
  • Max channel count: 576
  • Footprint: 0.95m x 0.94m / 3.13’ x 3.08’
  • Max no. of modules: 2

Your production line demands high throughput. Throughput requires test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides just that. Built upon a proven technology foundation, the Series 6 family ICT system improves test efficiency compared to previous offerings. With time-tested software, hardware, and programmability the Series 6 are fully backwards compatible with previous systems and make highly repeatable measurements.

  • Improved test efficiency with up to 4x faster Boundary Scan, Silicon Nails, and dynamic flash programming.
  • 100% backwards compatibility guarantees minimal downtime for installation and complete code compatibility.
  • Certified M2M capabilities such as IPC-CFX and Hermes offer increased operation efficiency, greater test data insights, shorter response times, and reduced operating expenses.
  • Opportunity to save energy costs with a smart power supply, which intelligently monitors power consumption and reports energy savings.
  • Industry leading support with Keysight On-site Now! Get quick, secure, hands-free help from the experts in record time.
  • Modern software licensing demystifies license costs, centralizes license management, and scales to meet production demand.

Key Specifications

Fixture Actuation
Vacuum
Max Node Count
2592
Max Parallel Testing
2
System Type
Offline System
Fixture Actuation
Max Node Count
Max Parallel Testing
System Type
Vacuum
2592
2
Offline System
View More
Fixture Actuation:
Vacuum
Max Node Count:
2592
Max Parallel Testing:
2
System Type:
Offline System
E9905G 2-Module In-Circuit Test (ICT) System Keysight

Interested in a E9905G?

Featured Resources for E9905G 2-Module In-Circuit Test (ICT) System, i327x Series 6

Application Notes 2023.01.05

Practical Bead Probe Implementation Strategy

Practical Bead Probe Implementation Strategy

This application note demonstrated how you could improve the test coverage on small and complex PCBAs by adopting the bead probe handbook's strategy. This paper showcased the different experiments on the stencil aperture and fixture probe style to validate the optimum parameters.

2023.01.05

Application Notes 2023.01.04

Essential Steps for Practical Bead Probe Implementation

Essential Steps for Practical Bead Probe Implementation

This document summarizes the bead probe handbook and other relevant white papers that describe effective methods for bead probe implementation. This paper shows how to use the formula to fine-tune the parameters to achieve optimal bead heights and emphasizes the importance of considering the impact of various variables such as bead height, length, and aperture size, as well as probe force, and selecting the appropriate probe head style for different types of applications.

2023.01.04

Application Notes 2022.09.23

Developing a Fixture for Extra-Large Printed Circuit Boards (PCBA)

Developing a Fixture for Extra-Large Printed Circuit Boards (PCBA)

The i3070 4-module Inline In-Circuit Tester is capable of meeting the stated board size requirements with the i3070 10.20p software version. This application note describes how to change some of the key parameters within the software to create the fixturing and test programs to accommodate a larger PCBA board requirement.

2022.09.23

Application Notes 2022.07.05

Test Program Migration to 10.x software

Test Program Migration to 10.x software

How to use system variable to minimize the effort on migrating the existing test program to run on i3070 software version 10.x or latest

2022.07.05

Application Notes 2022.04.25

Fixture Reusability Consideration From In-line to Offline

Fixture Reusability Consideration From In-line to Offline

This application note describes the differences between the i3070 Series 5 inline 4 module test system (E9986E) fixture and the offline 4 module test system fixture, as well as the fixture reusability considerations.

2022.04.25

Application Notes 2021.08.04

Bypass Link Conveyor Built-in i7090 and i3070 In-Circuit Inline Tester

Bypass Link Conveyor Built-in i7090 and i3070 In-Circuit Inline Tester

The built-in bypass link conveyor in In-Circuit tester saves you the floor space and easy to setup at the manufacturing floor.

2021.08.04

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