In this course, we'll cover everything you need to know about analyzing and characterizing jitter in high-speed digital systems.
Lesson 1 - Jitter Analysis Using Oscilloscopes
Introduces the concept of jitter and how it can be analyzed using oscilloscopes. Oscilloscopes can be used to measure jitter by capturing a signal and then analyzing the timing of the signal edges.
Lesson 2 - What is Jitter?
Introduces the concept of jitter and how it can affect the performance of high-speed digital systems.
Lesson 3 - Tools to Help you see Jitter Better
Learn how to use these tools to measure and analyze jitter, and you will also learn about the different types of jitter that can occur in digital signals. By the end of the lesson, you will be able to use the right tools to understand the jitter in your signals and to take steps to minimize its impact on your system performance.
Lesson 4 - Demo Time! Viewing Edge-to-Edge Jitter on the Oscilloscope
Demonstrates how to measure jitter on a real-world signal using an oscilloscope. The lesson uses a serial data signal with embedded clock, and shows how to use the oscilloscope's jitter analysis tools to identify and characterize the different types of jitter that are present in the signal.
Lesson 5 - Components of Total Jitter (TJ)
Discusses the different components that make up total jitter (TJ). TJ is the total amount of timing variation that occurs in a digital signal, and it is made up of two main components: random jitter (RJ) and periodic jitter (PJ).
Lesson 6 - Unbounded Random Jitter (RJ)
Learn about the causes of RJ and how to measure it using an oscilloscope. You will also learn how to use the oscilloscope's jitter analysis tools to characterize RJ and identify its sources.
Lesson 7 - Analyzing Serial Data Jitter: Software Clock Recovery and Jitter Plots
Study how to analyze serial data jitter using an oscilloscope. You will learn how to use the oscilloscope's jitter analysis tools to measure and visualize jitter, and how to use this information to identify the sources of jitter.
Lesson 8 - Duty-cycle-distortion
Duty-cycle-distortion (DCD) is a type of jitter that occurs when the width of a data bit varies from its ideal value. This can be caused by a number of factors, such as timing errors in the clock signal, noise, or variations in the data signal itself. DCD can degrade the performance of digital systems by reducing the accuracy of the data transfer. In this lesson, you will learn how to measure DCD using an oscilloscope. You will also learn how to identify the sources of DCD and how to minimize its effects.
Lesson 9 - Inter-symbol Interference
Inter-symbol interference (ISI) is a type of jitter that occurs when the edges of adjacent data bits overlap. This can cause errors in the data transfer, as the receiver may not be able to distinguish between the two bits. In this lesson, you will learn how to measure ISI using an oscilloscope. You will also learn how to identify the sources of ISI and how to minimize its effects.
Lesson 10 - Periodic Jitter (PJ)
Periodic jitter (PJ) is a type of jitter that occurs when the timing of a data bit is periodic. Learn how to identify the sources of PJ and how to minimize its effects.
Lesson 11 - Demo Time! Analyzing Serial Data Jitter on the Oscilloscope
Watch a demo that shows how to use the oscilloscope's jitter analysis tools to measure and characterize jitter in a serial data signal. The demo covers setting up the oscilloscope for jitter analysis, measuring jitter using the oscilloscope's jitter analysis tools, identifying the sources of jitter, and minimizing the effects of jitter.
Lesson 12 - Advanced Jitter Analysis with Separation
Learn about advanced jitter analysis techniques that can be used to separate different sources of jitter. You will also learn how to use these techniques to identify the root cause of jitter problems and to develop solutions to improve the performance of digital systems.
Lesson 13 - Jitter Analysis Using Oscilloscopes
Review the key concepts and techniques that you learned in this course. You will also learn about the different types of oscilloscopes that can be used for jitter analysis.
InfiniiVision Jitter Better-Best Bundles
Keysight Technologies offers two InfiniiVision X-Series oscilloscope bundles for high-speed jitter analysis: the High-Speed / Jitter Better Bundle and the High-Speed / Jitter Best Bundle. Both bundles save 25% off the list price when purchased as a bundle and include a four-channel oscilloscope, a two-channel function / arbitrary waveform generator, a differential active probe, and the ultimate bundle software option.
Jitter Fundamentals: Sources, Types, and Characteristics
As this application note explains, understanding the type of jitter, its component characteristics, and measurement vantage points can help engineers identify its causes and diminish its effects on circuits and products.
Finding Sources of Jitter with Real-Time Jitter Analysis
As data rates increase effects of jitter becomes critical and jitter budgets get tighter. Instruments such as real-time oscilloscopes and Bit Error Ratio Testers (BERT) are optimized for determining the total amount of jitter and worst-case eye-opening in your high-speed digital system and can be used to test for compliance based on industry standards.