i3070 Core Data Console
Infographics
Keysight i3070 Core Data Console (KS6166A)
A tester-based analytics solution that transforms i3070 ICT test data into actionable insights directly at the tester, helping teams troubleshoot faster and improve manufacturing performance.
Key Benefits
- Real-time Yield Monitoring – Track yield trends, identify top failing tests, and detect production issues early.
- Test Limit Validation – Monitor limit changes, trend shifts, and CPK variations to reduce false failures and improve test stability.
- Probe-Level Root Cause Analysis – Quickly pinpoint failures caused by probe contact, fixture issues, or component defects.
- Panel-to-Panel Comparison – Compare test panels side-by-side to identify hardware variations and production anomalies.
- Faster Troubleshooting – Consolidate critical test insights into a single interface for rapid diagnosis and corrective action.
- Improved Manufacturing Performance – Enhance yield visibility, reduce debug time, and support data-driven production decisions.