Vectorless Test: nanoVTEP vs VTEP
Application Notes
In the early 2000s, ball grid array and accessible Surface Mount Technologies (SMT) components were the standard on most printed circuit board assemblies (PCBAs). At that time, Keysight’s Vectorless Test Enhanced Probe (VTEP) was a real breakthrough for increasing coverage for in-circuit test. But nowadays, the integrated circuits (ICs) and accessible surface mount device (SMD) components are getting smaller such that they could be mounted onto PCBAs. This causes the spaces to condense; and the fixture density increases which limit the sensor plate and amplifier placement.