Column Control DTX

Test Techniques to Combat Tighter Design Margins

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Almost independent of the program, technology or functionality, the number one issue facing everyone is tackling the ever-increasing desire for tighter design margin. This has not only pushed designers and their simulation tools to the edge, it has kept test and test strategies one step behind the growing measurement needs. The result has been lower yields, greater false failures and a swelling number of no trouble founds from production through depot support. The necessity to develop test strategies, test processes and test techniques for accurate and repeatable measurements will soon become the limiting factor of future technologies. Without this, the cost of quality, test and support will spiral out of control. The bottom line is that tighter design margins are not going away, it’s time to develop test methodologies to embrace them.


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Column Control DTX