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Random telegraph noise (RTN) is a type of electronic noise observed in advanced MOSFETs. It is increasingly critical to measure and evaluate RTN precisely across a wafer because RTN significantly affects device reliability. RTN is critical not only for the reliability of a transistor but also for the reliability of the circuit design. The B1530A Waveform Generator / Fast Measurement Unit (WGFMU) allows you to make RTN measurements without any additional measurement equipment. The WGFMU module has a noise floor of less than 0.1 mV (rms) with current measurement sampling rates from 1 S/s to 200 MS/s and bandwidth extending from DC to 16 MHz. In addition, Keysight’s E4727E3 software developed for the B1500A enables you to perform on-wafer automated RTN measurement at a low cost, including the wafer prober control. Download this paper today to learn why the B1500A’s WGFMU module is the best solution for advanced MOSFET random telegraph noise measurement and how it can improve the efficiency of RTN measurement and data analysis.