Modulation Distortion with Load Pull
Webinars
Power amplifier designers need accurate device models to minimize the design cycle. Key performance metrics to measure include error vector magnitude (EVM), adjacent-channel leakage ratio (ACLR), output power, and gain. Characterizing transistor behavior with modulated stimulus under varying load conditions allows for more accurate device models, shortening time to market.
In part 1 of this webinar series, VNA Active Device Characterization Essentials, you will learn how to perform calibrated EVM measurements using a vector network analyzer with a modulation-distortion application and a vector signal generator. Our evolved approach allows for integrated control of a tuner to perform modulated transistor characterization under load-pull conditions.