How to Stimulate DUTs with Arbitrary Waveforms

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Advanced Benchtop Waveform and Function Generator
+ Advanced Benchtop Waveform and Function Generator
Advanced Benchtop Waveform and Function Generator
+ Advanced Benchtop Waveform and Function Generator

Inject Realistic Waveforms Into Your DUT

Engineers often need to test devices under realistic signal conditions instead of relying on idealized sine, square, or pulse outputs. Many validation workflows require arbitrary waveforms that can reproduce expected operating behavior, inject controlled defects at precise points, and preserve waveform shape across repeated test cycles to ensure consistent and meaningful Device Under Test (DUT) evaluation.

Waveform sequencing improves this process by allowing engineers to update only the signal segment that changes, reuse validated waveform sections, and automate transitions between waveform states without rebuilding the full waveform. This reduces development effort, speeds debugging, and makes DUT response testing more efficient, repeatable, and representative of real operating conditions.

Arbitrary DUT Stimulation Solution

Realistic DUT stimulation often requires more than idealized sine, square, or pulse outputs. Engineers need arbitrary waveforms that can reproduce expected operating conditions, inject controlled defects, and maintain repeatable signal behavior during functional testing. This makes it possible to evaluate DUT performance under more representative and demanding signal scenarios. With support for sequencing, trigger-based transitions, and efficient waveform segment reuse, Advanced Benchtop Waveform and Function Generators make it easier to update only the portion of a waveform that changes, automate transitions between signal states, and preserve waveform integrity across repeated runs. This helps streamline debugging and improve overall test repeatability.
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Block Diagram of Arbitrary DUT Stimulation Solution

Block Diagram of Arbitrary DUT Stimulation Solution

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