Accessories

• Test and validate high-speed technologies such as DDR5 / MIPI with the 25 GHz probe amplifier (AP2).
• Experience the highest input impedance in midband frequencies for low-energy probing.
  
• Boost test margins with the lowest signal degradation.
• Probe small devices with the super-flexible micro probe head or choose from the widest variety of compatible probe heads for your unique application.
• Measure differential, single-ended, and common mode signals with a single probe tip.
  
• Use with Infiniium UXR-, 90000 X-, Q-, V-, and Z-Series oscilloscopes.

Keysight’s MX0025A InfiniiMax Ultra Series probe amplifier improves usability because you can measure differential, single-ended, and common mode signals with a single probe tip.

When you use a probe to connect your signal to your oscilloscope, it becomes part of the circuit affecting your test. Your probe may be hiding signal details, loading down your signal, or distorting it. InfiniiMax Ultra Series probes have the lowest loading for minimal impact to your circuit. Boost your test margins and gain measurement confidence with their unprecedented accuracy. Ensure your entire measurement system is helping you see the truest representation of your signal.

These probes have the lowest noise and capacitive loading and the lowest loading across more frequencies due to their RC high impedance profile. The InfiniiMax Ultra Series supports InfiniiMode and has a user-defined AC calibration mode, a wider input voltage range, more accuracy with unique S-parameter characterization, lower capacitive loading, a wider input voltage range, micro / socketed probe heads for smaller density probing, and more bandwidths. The InfiniiMax Ultra Series has an RC input impedance architecture with the lowest loading and least signal distortion across the widest frequency range.

InfiniiMax Ultra probes have three attenuation ranges — 1:1, 4:1, and 8:1 — giving you superior noise performance and large voltage ranges, all while maintaining maximum bandwidth. The input range automatically configures depending on the size of the input signal and vertical scale of your oscilloscope.

Choose from the three flexible input dynamic ranges from 600 mVpp at 1:1, 2.5 Vpp at 4:1, and 5 Vpp at 8:1. Clearly see and know when your design is satisfactory, keep up with standards, easily probe small devices, and reduce test complexity with the InfiniiMax Ultra Series probes.

Powering multi-channel emulation scenarios

Keysight S9165A Transceiver Control Unit is a solution component that works with other Keysight products providing LO, reference signals, and communication control for Keysight Remote Radio Head Transceivers.

When combined with the F8820A/B Propsim RF Channel Emulator and M1742A remote radio head transceiver, S9165A enables a K-band channel emulation solution, S8825A, for testing NTN aerospace satellite links.  

The S9165A supports up to eight independent channels, options 010 - 080.  The S9165A provides USB control, two independent local oscillators, and one reference frequency output per channel, enabling control of up to 8 Keysight Remote Radio Head Transceivers.

The M1742A is the only Remote Radio Head supporting bi-directional testing at all 5G non-terrestrial networks (NTN) frequency bands with one hardware set. Two bi-directional RF ports support Tx and Rx verification. Two independent LO input ports support FDD and TDD measurements. Confidently test over the air at frequencies in the 5G NTN bands using one M1742A remote radio head (RRH). Verify Tx and Rx performance of 5G RFFEs, base stations, chipsets, and devices using stimulus and analysis provided by one of several Keysight platforms.

The M1749A is a Remote Radio Head supporting bi-directional testing at five mmWave frequency bands with one hardware set. Two RF ports support Tx and Rx verification. Confidently test over the air at mmWave frequencies in the 24, 28, 39, 40 GHz, and 47 GHz bands using one M1749A remote radio head (RRH). Verify Tx and Rx performance of 5G RFFEs, base stations, chipsets, and devices using stimulus and analysis provided by one of several Keysight platforms.

The M1749B is the only Remote Radio Head supporting bi-directional testing at five mmWave frequency bands with one hardware set. Two RF ports support Tx and Rx verification. Confidently test over the air at mmWave frequencies in the 24, 28, 39, 40 GHz, and 47 GHz bands using one M1749B remote radio head (RRH). Verify Tx and Rx performance of 5G RFFEs, base stations, chipsets, and devices using stimulus and analysis provided by one of several Keysight platforms. M1749B delivers an additional +3 dBm power compared to M1749A.

Measuring the power consumption of embedded technology to perform side channel analysis adds specific challenges to the measurement setup. Power lines on embedded devices are generally noisier, signals travel at a higher speed, and form factors are highly variable as compared to for example smart cards. Take on the challenge of performing side channel analysis on embedded devices, such as system-on-chip (SoC) devices and field programmable gate arrays (FPGA), with our DS1201A Passive Current Probe.

• Probe bandwidth 1 MHz 1 GHz
• Probe impedance 60 m + 10 H for f < 200 kHz
• Probe sensitivity with and 25 mV/mA without amplifier (into 50 impedance)
• Signal output with 50 impedance
• Built-in Tektronix CT1 current probe
• Frequency range: 0.1–2,500 MHz
• Gain at 500 MHz: 25 dB
• Noise figure at 500 MHz: 2.4 dB
• DC Power: 12 volts
• SMA Connector

Using ultrafast FPGA technology, the DS1160A Smartcard Voltage and Clock Glitcher can generate 2 ns faults with fully programmable pattern and control logic. The DS1160A has integrated circuitry for performing voltage and clock glitching and an output channel for controlling optical pulses on the DS1101A Fault Injection Laser System.

• Generate very short glitches using FPGA technology in the integrated digital pattern generator for very powerful tests
• Easily create any test scenario with the perturbation instruction set
• Reproduce tests with accurate logging of smartcard behavior
• Reduce testing time with automated testing of a large set of perturbation parameters
• Seamlessly integrate with DS1002A Pattern Based Trigger Generator and DS1101A Fault Injection Laser System
• Prevent card damage with adjustable current limiter
• Reach a high level of assurance with consistent and complete perturbation testing Does not require chip de-packaging

When testing for side channel leakage in a contactless solution, a reader’s 13.56 MHz carrier wave introduces significant noise during measurement. The Notch Filter and Demodulator consists of analog filters that reduce the radio frequency signal while preserving the leakage signal from a contactless smart card. As a result, you can reduce the input voltage range of the digital oscilloscope to minimize the quantization error and consequently achieve a better signal-to-noise ratio. While the DS1221A is designed to be used in combination with the High Precision Electromagnetic Probe​ for electromagnetic radio frequency analysis or Micropross MP300 TCL2 RF antenna for radio frequency analysis, the filter can be used with any side channel test system.