DS1121A Bidirectional Fault Injection Probe User Manual
Publication Number: DS1121-90002
Publication Date: 2024.11.01
Language: English
User Manuals

DS1121A Bidirectional Fault Injection Probe User Manual

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The Bidirectional Fault Injection Probe is an electromagnetic (EM) perturbation device used for fault injection (FI) attacks and measures the electromagnetic field during the attack.

The probe is capable of delivering fast, precise, and powerful electromagnetic pulses, used for inducing currents in metal layers and causing voltage glitches in CMOS logic gates.

This user manual covers the following topics:

  • What’s in the box
  • Safety instructions
  • What it does
  • Connecting a Glitch Pattern Generator
  • How to build a setup
  • Using the Base Unit
  • Setting up the power supply
  • How to verify your setup
  • Help and troubleshooting
  • Technical specifications