FET IV Characterization Using Precision SMUs
애플리케이션 노트
This application note presents the comprehensive IV characterization of Field-Effect Transistors (FETs) using the Keysight B2900C/CL series Source Measure Units (SMUs). The B2900C/CL series offers precise and efficient measurement capabilities, enabling accurate evaluation of FET performance through advanced measurement techniques and user-friendly graphical interfaces.