LF Noise Measurement with Switch Matrix Mainframe
애플리케이션 노트
Best Solution for LF Noise Measurement
Keysight E4727B (Advanced Low-Frequency Noise Analyzer; A-LFNA) allows you to measure the LF (Low Frequency) noise of semiconductor devices very easily. The E4727B consists of hardware and software. The user can measure LF noise by just entering the expected measurement conditions and the software will then set all parameters of hardware optimally. The E4727B can measure on-wafer devices as well as discrete devices. The Keysight Switch Matrix Mainframe (E5250A, B2200A/B2201A) is a useful instrument for wafer devices with Probe Card to increase throughput. Even with its low leakage design and capacitive compensation features, the Switch Matrix Mainframe may limit LF noise measurements with the E4727B A-LFNA. Understanding parasitic capacitance effects on LF noise measurement helps improve test results using these instruments together.