Automotive Device Quality Assurance Testing Under High-Temperature

Conditions up to 150 °C in Chamber

Today’s Automotive Device Development Requirements

• High performance and high reliability are rapidly increasing with the development of electric vehicles, autonomous driving, and advanced driver-assistance systems (ADAS).

• The reliability under high-temperature conditions is critical for semiconductor devices for vehicles in harsh environments.

• Any malfunction of these devices could lead to injuries, fatalities, legal liability, and mass product recalls.

• Accurate characterization and efficient debugging under high-temperature conditions is critical to ensuring the vehicle's performance and reliability.

The CX3300 Series waveform analyzer helps you with device development for automotive test under high-temperature conditions.

You can easily measure current and voltage accurately with ultra-low noise using a cable extension and up to 150 °C in the test chamber.

• CX3300A Series waveform analyzer has 200 MHz wide bandwidth, high-resolution / high-speed sampling at 16-bit (75 MSa/s) / 14-bit (1 GSa/s).

• CX1105A differential sensor covers -50 to and 150 °C with 1 m shielded twisted pair cable, sub-uV ultralow noise, maximum of 100 MHz bandwidth, maximum of 100 A measurement (depending on the shunt resistor), and > 80 dB wide dynamic range

You can perform long-duration measurements with a high sampling rate that captures rare anomalies and fast spikes.

• The data logger mode measures up to 100 hours with a maximum of 10 MSa / second. You can debug quickly by using waveform classification and detailed waveform analysis features.

• The anomalous waveform analytics feature classifies waveform data exceeding a terabyte to enable the identification of rare anomalies.

• The trend analyzer feature takes an in-depth look into the inflection point from the entire waveform's visualized statistical trend.

Summary

The CX3300 Series waveform analyzers has precision current / voltage measurement capability, ultra-low noise under high temperature conditions and powerful waveform analytics so you can:

• Improve the device design and performance by accurate characterization under high temperatures.

• Ensure the device’s reliability by capturing rare anomalies and fast spikes during the long-duration operation.

• Accelerate time-to-market of high performance and high reliability devices by quick anomalies identification and analysis from massive waveform data.

As a result, you can accelerate the development of high performance and high reliability devices used under high-temperature conditions for automotive.