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unnel/bofusegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,segmentation:business-unit/EISG,keysight:product-lines/1h,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/design-and-test-product/power-supply,keysight:dtx/solutions/facets/workflow-stage/manufacturing,keysight:dtx/solutions/facets/industry/automotive,keysight:dtx/solutions/facets/industry/semiconductor,segmentation:product-category/IC_Semi_Mfg,segmentation:funnel/bofu
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I test LIV per i dispositivi VCSEL richiedono un controllo preciso della corrente di iniezione e della misura della potenza luminosa in uscita per creare la curva LIV. Scoprite come eseguire test LIV a impulsi stretti per i vostri dispositivi VCSEL in diverse condizioni operative utilizzando un'unità sorgente/misura.
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