Per saperne di più
segmentation:campaign/IC_Semi_Mfg,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Optical_Modulation_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/3e,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductorsegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Optical_Modulation_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/3e,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductorsegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Optical_Modulation_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/3e,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductorsegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Optical_Modulation_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/3e,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductorsegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Optical_Modulation_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/3e,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductorsegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Optical_Modulation_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/3e,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductorsegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Optical_Modulation_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/3e,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductorsegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Optical_Modulation_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/3e,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductorsegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Optical_Modulation_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/3e,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductorsegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Optical_Modulation_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/3e,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor
Come automatizzare le misurazioni di potenza a livello di wafer nella fotonica al silicio
Automatizzare le scansioni della potenza ottica a livello di wafer per la caratterizzazione dei dispositivi fotonici al silicio, utilizzando laser sintonizzabili e attenuatori programmabili per misurare la perdita, la sensibilità e la saturazione su tutti i wafer con elevata ripetibilità.
Per saperne di più