Per saperne di più
segmentazione:campaign/Bench,segmentazione:product-category/DMMs_DAQs_Function_Generators,segmentazione:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentazione:business-unit/EISG,keysight:product-lines/gm,segmentazione:funnel/mofu,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/design-and-test-product/signal-generator,keysight:dtx/solutions/facets/workflow-stage/design,keysight:dtx/solutions/facets/industry/semiconductorsegmentazione:campaign/Bench,segmentazione:product-category/DMMs_DAQs_Function_Generators,segmentazione:categoria-prodotto/DMMs_DAQs_Function_Generators/Function_Generators,segmentazione:business-unit/EISG,keysight:product-lines/gm,segmentazione:funnel/mofu,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/design-and-test-product/signal-generator,keysight:dtx/solutions/facets/workflow-stage/design,keysight:dtx/solutions/facets/industry/semiconductorsegmentazione:campaign/Bench,segmentazione:product-category/DMMs_DAQs_Function_Generators,segmentazione:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentazione:business-unit/EISG,keysight:product-lines/gm,segmentazione:funnel/mofu,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/design-and-test-product/signal-generator,keysight:dtx/solutions/facets/workflow-stage/design,keysight:dtx/solutions/facets/industry/semiconductorsegmentation:campaign/Bench,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:categoria-prodotto/DMMs_DAQs_Function_Generators/Function_Generators,segmentazione:business-unit/EISG,keysight:product-lines/gm,segmentazione:funnel/mofu,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/design-and-test-product/signal-generator,keysight:dtx/solutions/facets/workflow-stage/design,keysight:dtx/solutions/facets/industry/semiconductorsegmentazione:campaign/Bench,segmentazione:product-category/DMMs_DAQs_Function_Generators,segmentazione:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentazione:business-unit/EISG,keysight:product-lines/gm,segmentazione:funnel/mofu,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/design-and-test-product/signal-generator,keysight:dtx/solutions/facets/workflow-stage/design,keysight:dtx/solutions/facets/industry/semiconductorsegmentation:campaign/Bench,segmentazione:product-category/DMMs_DAQs_Function_Generators,segmentazione:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentazione:business-unit/EISG,keysight:product-lines/gm,segmentazione:funnel/mofu,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/design-and-test-product/signal-generator,keysight:dtx/solutions/facets/workflow-stage/design,keysight:dtx/solutions/facets/industry/semiconductorsegmentazione:campaign/Bench,segmentazione:product-category/DMMs_DAQs_Function_Generators,segmentazione:categoria-prodotto/DMMs_DAQs_Function_Generators/Function_Generators,segmentazione:business-unit/EISG,keysight:product-lines/gm,segmentazione:funnel/mofu,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/design-and-test-product/signal-generator,keysight:dtx/solutions/facets/workflow-stage/design,keysight:dtx/solutions/facets/industry/semiconductorsegmentazione:campaign/Bench,segmentazione:product-category/DMMs_DAQs_Function_Generators,segmentazione:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentazione:business-unit/EISG,keysight:product-lines/gm,segmentazione:funnel/mofu,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/design-and-test-product/signal-generator,keysight:dtx/solutions/facets/workflow-stage/design,keysight:dtx/solutions/facets/industry/semiconductorsegmentation:campaign/Bench,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:categoria-prodotto/DMMs_DAQs_Function_Generators/Function_Generators,segmentazione:business-unit/EISG,keysight:product-lines/gm,segmentazione:funnel/mofu,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/design-and-test-product/signal-generator,keysight:dtx/solutions/facets/workflow-stage/design,keysight:dtx/solutions/facets/industry/semiconductorsegmentazione:campaign/Bench,segmentazione:product-category/DMMs_DAQs_Function_Generators,segmentazione:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentazione:business-unit/EISG,keysight:product-lines/gm,segmentazione:funnel/mofu,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/design-and-test-product/signal-generator,keysight:dtx/solutions/facets/workflow-stage/design,keysight:dtx/solutions/facets/industry/semiconductor
Come generare un segnale a doppio impulso per i dispositivi di alimentazione
I test a doppio impulso richiedono la generazione di forme d'onda di precisione, il controllo flessibile degli impulsi e la misurazione ad alta risoluzione. Scoprite come generare e analizzare una forma d'onda a doppio impulso.
Per saperne di più