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Keysight functional test systems offer a modular, flexible solution for testing complex electronic assemblies. With precision measurement, high-density switching, configurable power delivery, and synchronized signal acquisition, the system supports a wide range of analog, digital, and mixed-signal applications. Built-in automation and real-time monitoring streamline test development and improve coverage, making it ideal for validating devices like automotive ECUs, industrial controllers, and embedded boards. Request a quote for one of our popular configurations today. Need help selecting? Check out the resources below.
Easily configure, scale, and upgrade your test setup with modular instruments and switching, supporting diverse test needs and evolving product designs.
Capture analog, digital, and power signals simultaneously with time-aligned precision, crucial for validating functional behavior across complex systems.
Route multiple signals efficiently using advanced switching modules, enabling fast test sequencing and reducing fixture complexity in high-throughput environments.
Simplify test execution with integrated software that automates sequences, logs data, and enables repeatable, reliable test procedures across units and batches.
Form factor
Complete test system, Switch/Load unit (SLU), Complete test system - Mac panel interface, Complete test system - PXI modular, Complete test system - compact, Software, USB
Type
Automotive Electronics Functional Test System, Switch Load Unit, Functional Test System, Test Executive Software, Functional Test Platform, Functional Test Platform for EVSE, Adapter, Multiprotocol, Media Converter
Platform
Modular / LAN, VERSA Module Eurocard (VME), PXI, PXI and VME, Windows 32 bit, LAN, CAN FD, Ethernet, LIN, 100BASE-T1, 1000BASE-T1, MultiGBASE-T1
U8972A
The TS-5400 PXI functional Test System with Mac panel interface that supports up to 464 test nodes for testing electronics control modules via multi-DUT test.
The Keysight TS-5400 PXI Series Functional Test System provides automotive, aerospace and defense and industrial control manufacturers with an off-the-shelf PXI hardware and software platform with support for single or multiple DUT test. Designed for testing electronics control modules such as, power train control, complex body electronics and industrial controllers, the TS-5400 PXI Series helps manufacturers achieve higher throughput for their design validation and manufacturing functional test needs with the capacity to empower them to anticipate future functional test needs.
Get latest tips and information from the Keysight Automotive Functional Test Forum.
Learn how to accelerate software development and test integration using Keysight's TestExecSL Software.
E6198B
The E6198B Switch/Load Unit (SLU) utilizes a standard VERSA Module Eurocard (VME) type enclosure to bring you excellent switching solution for mechatronic type testing.
The Keysight Switch/Load Unit (SLU) utilizes a standard VERSA Module Eurocard (VME) type enclosure to bring you excellent switching solution for mechatronic type testing.
With the Keysight TS-5000 family of multi-channel load and switching cards, you have the option of switching stimulus or measurement signals up to 2A and loads of up to 30A.
Additionally, the SLU comes with added features that provide you with an 8-bit DIO that can be used for fixture control or ID, a pair of DAC channels to drive voltage controlled power supplies.
Learn more about the TS-5000 family of multi-channel load cards (PDF)
E2230C
TS-5040 is a compact automotive functional test system that provides manufacturers with a complete, versatile, and customized test solution.
The Keysight TS-5040 functional test system is a robust, and reliable test system that ensures an economical ownership experience. When coupled with Keysight software such as KS8400A PathWave Test Automation with KS8328A PathWave Test Executive for Manufacturing (PTEM) or TestExec SL with TS-5000 libraries, it provides a streamlined development process and accelerated deployment. The TS-5040 seamlessly integrates into heavily automated production areas. It is a minimalistic one-box solution for automotive and industrial applications that saves valuable rack and floor space.
Control the TS-5040 using the optional Keysight embedded PXI controller with a Core i3 processor, 16 GB RAM, 256 GB SSD, and built-in GPIB controller or the optional industrial PC controller with a Core i7 processor, 16 GB RAM, and 1 TB HDD.
The functional test system supports RF switching up to two cards of quad 1 x 4 RF switch (DC 3 GHz). It also supports up to 400 W of power sources.
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A functional test system is designed to validate the performance and behavior of a fully assembled electronic device by simulating real-world operating conditions. Unlike in-circuit testing, which verifies components in isolation, functional testing evaluates how the entire system performs as a unit. This includes verifying digital and analog signals, communication interfaces, power-up behavior, response to inputs, and overall system logic. The system often interfaces with the device through custom fixtures, connectors, and test software that simulates user input or operating conditions.
Functional testers are essential during the final stage of the production line to catch faults that are not detectable through visual inspection or component-level tests. These faults could include firmware issues, timing errors, signal integrity problems, or misconfigured peripherals. The systems are flexible and programmable, supporting various devices from automotive control units to telecom modules. Their modular architecture allows them to be adapted easily for different test requirements and product types.
Ensuring accuracy and repeatability in functional testing depends on consistent hardware configurations, reliable signal routing, well-calibrated instrumentation, and standardized test procedures. Modern systems achieve this by utilizing modular test platforms where each module has defined performance specifications and is regularly calibrated to industry standards. These systems often include high-resolution analog measurement units, digital signal generators, programmable power supplies, and RF measurement capabilities—each integrated to support diverse testing scenarios.
Repeatability is also driven by automation. Test software runs pre-programmed scripts that control signal timing, test conditions, and response evaluation with minimal human intervention, reducing variability and operator error. Furthermore, advanced error-handling routines detect anomalies in signal behavior or instrument responses and flag failures with detailed logs.
Data from each test station can be logged and compared across shifts and facilities to detect drifts or systematic issues. This ensures that production quality remains consistent, even as units are tested on different days, by various operators, or at other locations.
Functional test systems are ideal for testing various electronic products across multiple industries. Typical applications include embedded systems, communication modules, automotive ECUs, consumer electronics, industrial controllers, and power management devices. Any product that must perform a complex set of functions in real-world conditions can benefit from this level of testing.
For instance, an automotive ECU may require testing for multiple CAN or LIN bus interfaces, analog sensor inputs, digital control outputs, and power-up sequencing. A telecom module might need to verify data transmission rates, signal timing, and response under simulated network traffic. Industrial controllers may require high-voltage I/O checks, protocol compliance, and thermal behavior validation.
Functional testing is especially valuable when involved in firmware, communication protocols, or timing-sensitive operations. Integrating temperature chambers or vibration tables can also support environmental and reliability testing. These systems are versatile and scalable, handling simple pass/fail logic to highly complex multi-domain tests.
Test automation significantly enhances efficiency, accuracy, and throughput in high-volume manufacturing environments. By automating functional testing, repetitive manual tasks such as signal switching, input simulation, data recording, and pass/fail evaluation are handled entirely by software-controlled sequences. This reduces test cycle time and eliminates inconsistencies caused by operator variability.
Automated test systems can run 24/7 with minimal supervision, providing manufacturing teams with consistent results and faster feedback. This is especially beneficial when testing complex devices where timing, signal synchronization, and multiple interfaces must be evaluated simultaneously. The automation software also enables traceability by logging results for each unit, along with test conditions and timestamps, which is critical for quality control and audits.
Moreover, automation facilitates rapid product changeovers. Engineers can load new test profiles or configurations with minimal downtime, which is crucial for flexible manufacturing lines that handle multiple product variants. Over time, the system contributes to reduced costs, improved yield, and better product reliability.
When choosing a functional test system, several features are essential for ensuring long-term usability, flexibility, and performance. First, modularity is key systems should support plug-in modules that provide functionalities like analog measurement, digital pattern generation, RF testing, or protocol decoding. This allows the system to be tailored to specific test requirements and easily reconfigured for future products.
Another critical feature is software integration. The test platform should offer robust software tools that support automated test sequence creation, real-time monitoring, and data logging. Integration with other factory systems like MES or ERP can streamline production workflows. Signal integrity and measurement accuracy should be thoroughly evaluated, especially if your device under test has tight timing or voltage margins.
Scalability is also important. Whether you are testing one device at a time or multiple units in parallel, the system should scale without significant hardware changes. Finally, support for various communication protocols (I²C, SPI, CAN, USB, Ethernet) ensures compatibility with modern embedded systems.