How to Perform Accurate In-Fixture VNA Measurements

+ Vector Network Analyzer

In-Fixture VNA Measurement

An in-fixture vector network analyzer measurement connects a device under test through a test fixture rather than directly at the analyzer test ports. The setup consists of the analyzer, calibrated cables, fixture interfaces, and a repeatable device mounting arrangement. Engineers identify the desired device reference planes and determine which fixture effects must be characterized or removed. The analyzer acquires scattering parameters across the required frequency span, with port power and frequency settings appropriate to the device. Fixture transmission and reflection can contribute to the observed response, so the measured data must be interpreted in relation to the fixture and its electrical behavior.

The procedure starts with calibration at accessible interfaces and fixture characterization or correction supported by available standards and measurement settings. Corrected scattering parameters are then measured with consistent device contact pressure and connection geometry. Repeat installations assess connector, launch, and fixture sensitivity; known devices or reference structures support verification when available. Final traces include fixture, calibration, correction, sweep, and repeatability records, helping distinguish fixture effects from device response without assuming perfect parasitic removal.

Performing Accurate In-Fixture VNA Measurements Solution

Perform accurate in-fixture measurements using a calibrated vector network analyzer (VNA), suitable radio frequency (RF) interconnects, and fixture characterization techniques that account for unwanted transmission and reflection effects. The measurement setup requires compatible calibration standards, stable fixture connections, and appropriate error-correction methods to establish accurate measurement reference planes. The measurement workflow begins with calibration at accessible reference planes, followed by fixture characterization and the application of appropriate de-embedding techniques. Engineers can then measure insertion loss, return loss, and transmission response while reducing the influence of fixture-related measurement errors. The solution supports scattering parameter (S-parameter) measurements with configurable frequency sweeps, intermediate-frequency bandwidth, and trace averaging. Combined with compatible calibration standards and fixture correction methods, these capabilities enable repeatable device characterization across the required frequency range. The resulting corrected S-parameters allow engineers to evaluate device performance while accounting for the fixture's electrical characteristics and the limitations of the selected correction method.

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N5224B PNA Microwave Network Analyzer

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Application Note

De-Embedding and Embedding S-Parameter Networks Using a Vector Network Analyzer
Application Note

VNA Measurement Uncertainty
Application Note

10 Hints for Making Better Network Analyzer Measurements

Application Note

De-Embedding and Embedding S-Parameter Networks Using a Vector Network Analyzer
Application Note

VNA Measurement Uncertainty
Application Note

10 Hints for Making Better Network Analyzer Measurements

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Maximum frequency	43.5 GHz
Number of built-in ports	2 4
Configurable test ports	4
Dynamic range	128 dB @35 GHz
Maximum output power	13 dBm @35 GHz
Maximum number of sources	2

How to Perform Accurate In-Fixture VNA Measurements

In-Fixture VNA Measurement

Performing Accurate In-Fixture VNA Measurements Solution

See Block Diagram of Performing Accurate In-Fixture VNA Measurements Solution

Explore Products in Our Performing Accurate In-Fixture VNA Measurements Solution

N5224B PNA Microwave Network Analyzer

N5224B PNA Microwave Network Analyzer

Specs

Discover Resources and Insights

De-Embedding and Embedding S-Parameter Networks Using a Vector Network Analyzer

VNA Measurement Uncertainty

10 Hints for Making Better Network Analyzer Measurements