How to Recreate Intermittent Sensor Faults

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Essential Benchtop Waveform and Function Generator
+ Essential Benchtop Waveform and Function Generator
Essential Benchtop Waveform and Function Generator
+ Essential Benchtop Waveform and Function Generator

Inject Repeatable Fault Conditions

Intermittent sensor faults are difficult to debug because they may appear only briefly, occur at irregular intervals, or depend on timing conditions that are hard to reproduce with a live sensor. Arbitrary waveform generation is used to create repeatable dropouts, glitches, level shifts, and abnormal transitions that mimic those nonideal signal behaviors.

A waveform generator applies the fault-injected signal to the device under test while an oscilloscope, logic analyzer, or other measurement instrument observes the resulting response. Dual-channel operation can align related events, add a trigger condition, or compare fault timing against another control or reference signal.

Sensor Fault Reproduction Solution

Reproducing intermittent sensor faults requires a controllable stimulus source that can insert brief glitches, missing segments, abnormal transitions, and timing disturbances into an otherwise normal signal. Keysight Essential benchtop waveform and gunction generators support this workflow by generating arbitrary waveforms that can be edited, replayed, and adjusted to match the signal conditions under investigation. These waveform and function generators provide dual-channel output for synchronized stimulus or reference patterns, along with arbitrary waveform capability for repeatable bench debug. This helps engineers observe embedded system response, compare behavior across repeated runs, and isolate fault-handling issues under controlled signal conditions.
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See Block Diagram of Sensor Fault Reproduction Solution

Block diagram of sensor fault reproduction solution

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