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3D Interconnect Designer
3D Interconnect Designer provides a flexible modeling and optimization environment for any advanced interconnect structure, including chiplets, stacked die, packages, and PCBs.
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Precision In-Circuit Testing for Production
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Achieve 200+ Gbaud multi-level modulated signals with high-speed AWGs for digital and optical standards.
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Accessories
Explore the complete portfolio of Keysight accessories designed to complement and extend your instruments. Use the filters below to quickly find compatible accessories such as modules, cables, adapters, and other system components to configure, expand, and optimize your test system for your specific measurement needs.
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InfiniiMax Ultra Probe Amplifier, 25 GHz
Best probes for measuring signals found in the latest DDR5 and MIPI standards.
Best probes for measuring signals found in the latest DDR5 and MIPI standards.
InfiniiMax Ultra Probe Amplifier, 25 GHz
MX0025A
Best probes for measuring signals found in the latest DDR5 and MIPI standards.
- Test and validate high-speed technologies such as DDR5 / MIPI with the 25 GHz probe amplifier (AP2).
- Experience the highest input impedance in midband frequencies for low-energy probing.
- Boost test margins with the lowest signal degradation.
- Probe small devices with the super-flexible micro probe head or choose from the widest variety of compatible probe heads for your unique application.
- Measure differential, single-ended, and common mode signals with a single probe tip.
- Use with Infiniium UXR-, 90000 X-, Q-, V-, and Z-Series oscilloscopes.
Keysight’s MX0025A InfiniiMax Ultra Series probe amplifier improves usability because you can measure differential, single-ended, and common mode signals with a single probe tip.
When you use a probe to connect your signal to your oscilloscope, it becomes part of the circuit affecting your test. Your probe may be hiding signal details, loading down your signal, or distorting it. InfiniiMax Ultra Series probes have the lowest loading for minimal impact to your circuit. Boost your test margins and gain measurement confidence with their unprecedented accuracy. Ensure your entire measurement system is helping you see the truest representation of your signal.
These probes have the lowest noise and capacitive loading and the lowest loading across more frequencies due to their RC high impedance profile. The InfiniiMax Ultra Series supports InfiniiMode and has a user-defined AC calibration mode, a wider input voltage range, more accuracy with unique S-parameter characterization, lower capacitive loading, a wider input voltage range, micro / socketed probe heads for smaller density probing, and more bandwidths. The InfiniiMax Ultra Series has an RC input impedance architecture with the lowest loading and least signal distortion across the widest frequency range.
InfiniiMax Ultra probes have three attenuation ranges — 1:1, 4:1, and 8:1 — giving you superior noise performance and large voltage ranges, all while maintaining maximum bandwidth. The input range automatically configures depending on the size of the input signal and vertical scale of your oscilloscope.
Choose from the three flexible input dynamic ranges from 600 mVpp at 1:1, 2.5 Vpp at 4:1, and 5 Vpp at 8:1. Clearly see and know when your design is satisfactory, keep up with standards, easily probe small devices, and reduce test complexity with the InfiniiMax Ultra Series probes.
Fault Injection Laser System
The DS1101A Fault Injection Laser System is an upgraded optical solution for the next generation of fault injection attacks.
The DS1101A Fault Injection Laser System is an upgraded optical solution for the next generation of fault injection attacks.
Fault Injection Laser System
DS1101A
The DS1101A Fault Injection Laser System is an upgraded optical solution for the next generation of fault injection attacks.
Protecting chips against laser fault attacks is one of the main security challenges in the smart card industry. With the DS1101A Fault Injection Laser System, perform advanced laser fault attacks that meet the highest international standards to assess if a smart card is secured against laser attacks. The DS1101A offers a set of new features meeting the latest timing and power requests from fault injection experts around the world. The special set of lasers with dedicated optics and ultra-fast and flexible control create the ultimate fault injection test solution. Its integration with the Inspector software further ensures that automation and analysis are covered by extendible modules which are flexible and easy to use.
- Supports front- and back-side attacks
- Integration with Inspector’s software and fault analysis modules
- Zoomable camera for easy navigation and automated Z-axis
- Fast multi-time glitching and accurate digital scaling with fast and predictable response to trigger pulse
- Multi-spot and IR navigation upgrades available
- Automatic scanning of a chip’s surface with integrated motorized XYZ stage
- Camera inspection of laser spot and location on chip area
- High repetition accuracy on motorized axes
- SDK available for integration into custom setups
1064 nm Multimode Fault Injection Laser
The DS1112A is a 1064 nm wavelength near infrared (NIR) multimode diode laser for fault injection, with a high power rating and configurable pulse length.
The DS1112A is a 1064 nm wavelength near infrared (NIR) multimode diode laser for fault injection, with a high power rating and configurable pulse length.
1064 nm Multimode Fault Injection Laser
DS1112A
The DS1112A is a 1064 nm wavelength near infrared (NIR) multimode diode laser for fault injection, with a high power rating and configurable pulse length.
The DS1112A 1064 nm Multimode Fault Injection Laser uses multimode laser diodes with a high power rating, enabling coarse chip surface scanning with large spot size and sufficient intensity within spot.
- 1064 nm wavelength NIR laser
- Laser pulse power: 30 W
- Configurable pulse length as small as 2 ns
- High pulse frequency allows multi-pulse fault injection attacks
- Short delay between trigger pulse and actual light pulse in combination with minimal jitter allows for accurate laser pulse timing
- Wide range of spot size: Choose from coarse to detailed chip surface scanning with objectives and spot size reducer
- Long-life laser diode with minimal aging
- Integrates with Keysight products DS1101A, DS1102A, DS1160A, and DS1180A
Bidirectional Fault Injection Probe
Induce electromagnetic pulses to perform localized faults on modern chips.
Induce electromagnetic pulses to perform localized faults on modern chips.
Bidirectional Fault Injection Probe
DS1121A
Induce electromagnetic pulses to perform localized faults on modern chips.
The Keysight DS1121A bidirectional fault injection probe induces high power, electromagnetic (EM) pulses on a user-defined chip location. The fast and predictable pulse meets the demands of international testing laboratories and manufacturers.
Testers can control the set of probes, XY table, and camera with Keysight’s EM fault injection software, which also allows automation of testing scenarios and easy reporting for further analysis and refinements. Use the bidirectional fault injection probe in stand-alone or custom environments—or integrate with your own hardware and software.
With increasingly challenging chip packages and sophisticated light-sensitive sensors to prevent optical laser faults, this new testing vector for fault injection scenarios bypasses traditional measures and takes the next step in high-end security tests.
The Keysight bidirectional fault injection probe offers the following features:
- Does not require chip de-packaging
- Light sensor meshes do not detect EM glitches
- Flips value of logic cells on target device
- Offers lower chance of permanent chip damage compared to laser glitching
- Enables adjustable high power pulses and includes different coils to generate different EM fields over a chip
- Allows configuration of fast and short pulses with software
- Provides fast and predictable response to trigger
- Fits Keysight precision XYZ stage and multimode fault injection laser for automated scanning
- Includes standard EM-FI transient coils and one crescent probe ferrite
Unidirectional Fault Injection Probe
The DS1120A Unidirectional Fault Injection Probe performs localized faults on modern chips using fast, predictable, and high-powered electromagnetic pulses.
The DS1120A Unidirectional Fault Injection Probe performs localized faults on modern chips using fast, predictable, and high-powered electromagnetic pulses.
Unidirectional Fault Injection Probe
DS1120A
The DS1120A Unidirectional Fault Injection Probe performs localized faults on modern chips using fast, predictable, and high-powered electromagnetic pulses.
With increasingly challenging chip packages and sophisticated light-sensitive sensors employed to prevent optical laser faults, Keysight presents a new, powerful testing vector for fault injection (FI) scenarios on modern chips. The Unidirectional Fault Injection Probe induces fast, high-powered, electromagnetic pulses on a user-defined location of a chip. Unidirectional FI testing allows you to bypass traditional countermeasures and provides the next step in high-end security tests.
The DS1120A’s easy setup and testing process saves time, providing a fast and predictable pulse that meets international testing lab and manufacturer requirements. The set of probes, XY table, and camera offer a complete setup that testers can control and parameterize flexibly through the Inspector FI software. The software allows testing automation and easy reporting for further scenario analysis and refinements. The Unidirectional Fault Injection Probe can be used standalone or in custom environments as well as integrated with your own hardware and software.
- Does not require de-packaging the chip
- Electromagnetic glitches not detected by light sensor meshes
- Flips value of logic cells on target device
- Lower chance of permanent chip damage compared to laser glitching
- Adjustable, high-powered pulses
- Different coils included to generate different electromagnetic fields over a chip
- Fast and short pulses configurable from software
- Fast and predictable response to trigger
- Fits Precision XYZ Stage of High Precision Electromagnetic Probe for automated scanning
Mounts on Precision XYZ Stage of High Precision Electromagnetic Probe with:
- 1 Crescent probe ferrite
- High Precision Fault Injection Probe Tips
Dual Laser Fault Injection System
Reproduce a successful dual laser fault injection by generating two laser spots using the DS1102A Dual Laser Fault Injection System.
Reproduce a successful dual laser fault injection by generating two laser spots using the DS1102A Dual Laser Fault Injection System.
Dual Laser Fault Injection System
DS1102A
Reproduce a successful dual laser fault injection by generating two laser spots using the DS1102A Dual Laser Fault Injection System.
Countermeasures for fault injection are becoming more advanced. To bypass some of these countermeasures, a security evaluator needs to be able to generate multiple laser pulses at different locations. The DS1102A lets you generate two laser spots with independent location and timing.
- Work with different laser sources
- Speed up the evaluation process
- Perform multi-pulse attacks with DPSS laser
- Control automated scanning with Inspector and motorized positioning of both laser spots
- Achieve high position accuracy and resolution
- Use the wide field of view to create a relatively large distance on die between two laser spots
1064 nm Diode Pumped Solid State Fault Injection Laser
The DS1114A 1064 nm Diode Pumped Solid State Fault Injection Laser is a NIR laser offering fast and reliable triggering.
The DS1114A 1064 nm Diode Pumped Solid State Fault Injection Laser is a NIR laser offering fast and reliable triggering.
1064 nm Diode Pumped Solid State Fault Injection Laser
DS1114A
The DS1114A 1064 nm Diode Pumped Solid State Fault Injection Laser is a NIR laser offering fast and reliable triggering.
The DS1114A 1064 nm Diode Pumped Solid State Fault Injection Laser complements diode lasers and boasts better fault injection features compared to laser cutter systems.
- NIR laser with 1064 nm wavelength
- Short trigger time
- Easy control of output power
- Short pulse duration (5 kW)
- Avoids degradation, providing the same output over time
High Precision Electromagnetic Probe
The DS1203A High Precision Electromagnetic Probe, a highly precise probe used in side channel analysis, picks up electromagnetic emissions from semiconductor circuits.
The DS1203A High Precision Electromagnetic Probe, a highly precise probe used in side channel analysis, picks up electromagnetic emissions from semiconductor circuits.
High Precision Electromagnetic Probe
DS1203A
The DS1203A High Precision Electromagnetic Probe, a highly precise probe used in side channel analysis, picks up electromagnetic emissions from semiconductor circuits.
The High Precision Electromagnetic Probe, a highly sensitive probe used in side channel analysis, picks up electromagnetic emissions from semiconductor circuits. The probe has a mechanism that allows you to swap out three different probe tips of varying sizes: 0.2 mm, 0.5 mm, and 1.25 mm. All tips have a directed coil and a protective Teflon shell. Normally used in combination with an XYZ-motion platform, the probe can pick up electromagnetic fields with frequencies of up to 6 GHz, converting them into an AC signal.
By moving over the surface of a target, the DS1203A can find highly active circuits, or hotspots. The signals picked up on a hotspot comprise the measurements for simple or differential electromagnetic analysis. The High Precision Electromagnetic Probe has a variable gain mechanism, which you can set by hand or through an external device such as the Spider and can vary based on the target’s characteristics.
1.5 A Glitch Amplifier
The DS1140A 1.5 A Glitch Amplifier is used to generate and measure glitches, testing for fault injections and side channel attacks on embedded devices.
The DS1140A 1.5 A Glitch Amplifier is used to generate and measure glitches, testing for fault injections and side channel attacks on embedded devices.
1.5 A Glitch Amplifier
DS1140A
The DS1140A 1.5 A Glitch Amplifier is used to generate and measure glitches, testing for fault injections and side channel attacks on embedded devices.
The 1.5 A Glitch Amplifier is designed to make your fault injection tests applicable to a wide range of embedded targets. Easily connect the 1.5 A Glitch Amplifier to the Spider or VC Glitcher to produce sharp and accurate glitches on the target and to an oscilloscope to measure and view the glitches that you generate.
Designed to drive the input pin of an embedded processor, the 1.5 A Glitch Amplifier has virtually 0 Ω output impedance. The DS1140A can operate as a single power supply between 0 and 4 volts (V). This voltage is set in Inspector and controlled via the Spider or VC Glitcher.
The 1.5 A Glitch Amplifier has an amplification factor of two. For example, when setting a continuous voltage level of 2 V and a glitch peak voltage of 3 V, the voltage levels between the Spider or VC Glitcher and the 1.5 A Glitch Amplifier are 1 and 1.5 V, respectively. Consequently, the voltage levels between DS1140A and an embedded processor are respectively 2 and 3 V.
- Increased glitch success rate due to sharper glitches
- Integrated current and power monitor
- Amplifies glitches produced by the Spider or VC Glitcher up to 1.5 A peak-to-peak
- Allows glitching embedded devices such as FPGAs and SOCs
- Easy connection to your target via one of the three output connectors that Glitch Amplifier II offers
- Easy to position closely above your target
- Includes Glitch Amplifier Needle
- Optional 3D positioner (for Glitch Amplifier Needle)
- Can be used in combination with EM probe station baseplate. Glitch Amplifier II exactly fits the baseplate’s grid.
Active Current Probe
The DS1202A Active Current Probe is a highly sensitive probe that detects electrical currents, measuring a target device’s power consumption.
The DS1202A Active Current Probe is a highly sensitive probe that detects electrical currents, measuring a target device’s power consumption.
Active Current Probe
DS1202A
The DS1202A Active Current Probe is a highly sensitive probe that detects electrical currents, measuring a target device’s power consumption.
The Active Current Probe is a high-frequency probe that actively picks up electrical currents. Used in side channel analysis to measure a target device’s power consumption, the highly sensitive DS1202A is inserted in the power supply line of a target and can transfer current variations of up to 2 GHz. The Active Current Probe is used in combination with a base unit, which can be used to amplify the measured signal.
- Bandwidth 1 MHz–2,000 MHz
- Maximum continuous current 100 mA (RMS) AC
- Maximum pulse current 5 A
- Current measurement circuit ≤ 0.082 Ω, ≤ 0.042 µH
- 40 dB of gain with base unit max
Transceiver
Improve signal-to-noise ratio in your EM or RF setup for a smoother and faster testing process with the DS1001A Transceiver.
Improve signal-to-noise ratio in your EM or RF setup for a smoother and faster testing process with the DS1001A Transceiver.
Transceiver
DS1001A
Improve signal-to-noise ratio in your EM or RF setup for a smoother and faster testing process with the DS1001A Transceiver.
445 nm Multimode Fault Injection Laser
The DS1110A is a 445 nm wavelength blue multimode diode laser for fault injection, with a high power rating and configurable pulse length.
The DS1110A is a 445 nm wavelength blue multimode diode laser for fault injection, with a high power rating and configurable pulse length.
445 nm Multimode Fault Injection Laser
DS1110A
The DS1110A is a 445 nm wavelength blue multimode diode laser for fault injection, with a high power rating and configurable pulse length.
The DS1110A 445 nm Multimode Fault Injection Laser uses multimode laser diodes with a high power rating, enabling coarse chip surface scanning with large spot size and sufficient intensity within spot.
- 445 nm wavelength blue laser
- Laser pulse power: 3 W
- Configurable pulse length as small as 2 ns
- High pulse frequency allows multi-pulse fault injection attacks
- Short delay between trigger pulse and actual light pulse in combination with minimal jitter allows for accurate laser pulse timing
- Wide range of spot size: Choose from coarse to detailed chip surface scanning with objectives and spot size reducer
- Long-life laser diode with minimal aging
- Integrates with Keysight products DS1101A, DS1102A, DS1160A, and DS1180A
