Digital and RF Measurement Education

Improve your understanding of digital and RF design and test by learning with metrology and measurement experts. Learn the basics of RF measurement, design and simulation techniques. Find out how to cut through the challenges of gigabit digital designs. Explore digital and RF measurement videos, application notes, technical seminars and technology/product videos.

Metrology and Calibration

Feel confident that Keysight metrology is behind every measurement you make.

Experience measurement confidence with metrology and measurement

Measurement Confidence

Know that every measurement is traceable to National Metrology Institutes (NMIs) through Keysight-engineered calibration procedures that verify instrument specifications.

Rely on Keysight for advanced metrology

Advanced Metrology

Rely on Keysight engineers who work with the NMIs to develop rigorous measurement techniques in engineering metrology and emerging technologies.

Engineering metrology assists with metrology and measurement

Metrology Expertise

Stay up-to-date on changing compliance requirements and their practical applications by working with Keysight metrologists who collaborate with international standards organizations.

Metrology Events

Expand your metrology network while learning at the same time by attending upcoming events.

Learn about Measurement Uncertainty and Risk

White Papers 2018.12.07

Uncertainty Analysis for Uncorrelated Input Quantities and a Generalization Welch-Satterthwaite Formula

Uncertainty Analysis for Uncorrelated Input Quantities and a Generalization Welch-Satterthwaite Formula

The Guide to the Expression of Uncertainty in Measurement (GUM) has been widely adopted in the different fields of the industry and science. Learn how to use for uncorrelated input quantities.

2018.12.07

White Papers 2019.01.04

Revisiting Mismatch Uncertainty with the Rayleigh Distribution

Revisiting Mismatch Uncertainty with the Rayleigh Distribution

This paper examines several important aspects of estimating mismatch uncertainty, which is often a major component of the total uncertainty for RF and microwave measurements.

2019.01.04

White Papers 2018.12.05

Establishing Traceability for Quantities Derived from Multiple Traceable Quantities

Establishing Traceability for Quantities Derived from Multiple Traceable Quantities

Provides method of developing traceability for measurements (eg. phase noise) that have no SI units.

2018.12.05

Application Notes 2018.12.11

Using Calibration to Optimize Performance in Crucial Measurements

Using Calibration to Optimize Performance in Crucial Measurements

This application covers two goals: help you ensure that you get the calibration you expect (and deserve), and help you improve effective measurement performance through innovative use of calibration.

2018.12.11

White Papers 2018.12.03

Calibration Process Innovation Using Non-Required Guard Banded Testing

Calibration Process Innovation Using Non-Required Guard Banded Testing

Calibration services vary as to how to set the acceptance limits compared to the required tolerance. Using a guard band to reduce the acceptance limit will increase the confidence in the calibration.

2018.12.03

White Papers 2018.12.05

Isolate Analyzing and Sourcing Errors Near Reference Frequency Harmonics

Isolate Analyzing and Sourcing Errors Near Reference Frequency Harmonics

When performing a calibration, the risk of incorrectly declaring a device as in-tolerance (false-accept risk) is dependent upon several factors such as the specified tolerance limit and guard band.

2018.12.05

White Papers 2018.12.13

Using a Manufacturer’s Specification as a Type B Error Contribution

Using a Manufacturer’s Specification as a Type B Error Contribution

Examines these issues in the informal context of a Pachinko gambling device. As a result, it will become clear why an uncertainty analysis (employing TYPE B data) is a worst case analysis.

2018.12.13

Application Notes 2018.12.03

Understanding Measurement Risk

Understanding Measurement Risk

An intuitive explanation of these probability density functions drawing on Monte Carlo simulation to demonstrate the relationship between a device’s true value and the corresponding measured value. Keywords: measurement risk, calibration, metrology, monte carlo

2018.12.03

White Papers 2018.12.18

A Guard-Band Strategy for Managing False-Accept Risk

A Guard-Band Strategy for Managing False-Accept Risk

When performing a calibration, the risk of incorrectly declaring a device as in-tolerance (false-accept risk) is dependent upon several factors such as the specified tolerance limit and guard band.

2018.12.18

White Papers 2018.12.11

Language of Specifications

Language of Specifications

This paper explains some of the arcane language used in describing a product's characteristics.

2018.12.11

White Papers 2018.12.13

ATE System Level Calibration and Its Impact on Cost, Quality and Schedule

ATE System Level Calibration and Its Impact on Cost, Quality and Schedule

This paper proposes an alternative method to provide system level specification and system measurement calibration which will extend the system’s ability to be used for multiple products.

2018.12.13

Application Notes 2019.04.18

Calculating Uncertainty Using Digital Multimeter Ratio Measurement Techniques

Calculating Uncertainty Using Digital Multimeter Ratio Measurement Techniques

This paper compares three DMM ratio measurement techniques for determining the traceable value and measurement uncertainty of an unknown input.

2019.04.18

Technical Overviews 2018.12.16

Specifications Guidelines

Specifications Guidelines

Keysight Technologies has definitions for its Test & Measurement product specifications and how they are presented. The following material is extracted from these manufacturing recommendations.

2018.12.16

Fundamentals of Electronic Test and Measurement

Browse the application notes, seminars, and training classes here for measurement techniques and be sure to visit our Keysight forums for the latest discussions.

Additional Resources

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