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W3608B PathWave ADS Core, EM Design, Layout, RFPro, RF Ckt Sim, Sys-Ckt Verification, Complete VTBs
Most Trusted RF and Microwave Design Software in the Industry
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PathWave ADS and EM design environments with 3D RF layout for multi-technology RF module design and module level DRC/LVS/LVL verification for error-free assembly.
Highlights
The W3608B PathWave ADS Core, EM Design, Layout, RFPro, RF Ckt Sim, Sys-Ckt Verification, Complete VTBs includes:
- 3D RF layout for multi-technology RF module and packaging design
- Module Level physical verification (DRC, LVS, LVL)
- HB, Envelope, Transient/Convolution nonlinear circuit simulators
- RFPro EM (Momentum and FEM) simulators
- Error Vector Magnitude (EVM) optimization at circuit level
- Comprehensive nonlinear stability analysis
- Virtual Test Bench libraries for Circuit-in-System verification against industry standards such as 5G, automotive radars and WIFI
- EM Design enables the creation and import of parameterized 3D components into ADS
PathWave ADS bundle for multi-technology RF module physical design and module level verification (DRC, LVS, LVL) for error free assembly. RFPro EM simulators (Momentum and FEM) allows any selected electrical nets and components to be simulated without layout modifications or cookie cutting. Full suite of nonlinear circuit simulators enables RF modules to be designed for unconditional nonlinear stability, optimal modulated RF signal EVM performance at the circuit level. RFPro EM-circuit cosimulation ensures EM effects of packaging and interconnects are accounted for. Circuit-in-System verification test benches (VTBs) verify circuit performance compliance with a comprehensive library of industry standard system level specs such as 5G, automotive radars and WIFI to ensure consistent early design wins.
Critical Electrothermal Considerations
Electrothermal steady-state and transient simulation addresses electrothermal degradation of circuit performance such as:
- AM-AM & AM-PM distortion leading to poor EVM & ACLR in modulated signals
- Device impedance shift causing impedance mismatch, reduced efficiency and reliability
- Thermal runaway failure from additive temperature rise when heat generated exceeds heat dissipated
Add the following elements to this bundle for electrothermal analysis:
Note: W3608B has been modified to remove 4096-QAM due to US export control ECCN 5D001. Please add the W3047E to your purchase to access 4096-QAM capability subject to relevant export control approvals in your geographic region.
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