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    • U7231B DDR3 and LPDDR3 Compliance Test Application for Infiniium Series Oscilloscopes [Discontinued]

    U7231B DDR3 and LPDDR3 Compliance Test Application for Infiniium Series Oscilloscopes

    Product Status:
    Discontinued / Currently Supported
    Discontinued / Currently Supported
    Technical Support
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    • Overview and Features
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    HIGHLIGHTS

    Features

    • Compliance testing of clock jitter, electrical and timing measurements in accordance to JEDEC specifications
    • Superior signal integrity and probing that meets DDR3 and LPDDR3 measurement needs
    • JEDEC test measurement with navigation capability for DDR debug
    • Statistical analysis on read or write data for margin testing

    Requirements:

    • Infiniium 4.20 or higher software revision for 9000/90000 Series oscilloscopes
    • U7231B DDR3 and LPDDR3 Test Application (N5435A-053 for application server license) or N5459B DDR software bundle option (contains U7233A, N5413B, U7231B and N6462A)
    • E2688A High-Speed SDA (N5435A-003 for application server license)
    • W2635/6A DDR3 BGA interposer

    Recommendations:

    • Recommended U7231B-3FP DDR3 and LPDDR3 Debug Tool
    • Recommended N5414B InfiniiScan Event Identification Software (Option N5435A-004 for application server license)- Optional
    • U7231B-7FP LPDDR3 switch matrix option (N5435A-713 server based license) for use with N8990K-A36 LPDDR3 switch matrix

    Extensibility:

    • Use the N5467A User Defined Application tool (www.keysight.com/find/uda) to:
    • Create and fully integrate custom tests, configuration variables and connection instructions
    • Insert external application calls into the run sequence, such as MATLAB scripts or your device controller
    • Configure additional external instruments used in your test suite

    Use the DDR3 and LPDDR3 application to test, debug and characterize your DDR3 and LPDDR3 designs quickly and easily. It automatically configures the oscilloscope for each test and generates an informative HTML report at the end of the test. The application not only compare the results with the specification test limit but also includes margin analysis which indicates how closely the device passes or fails each test. On top of that, the complex analysis of the DDR3 and LPDDR3 signals is taken care by the application which saves user time and effort if the measurements are done manually.

    NOTE: This product has a June 1, 2020 end of life and is replaced by D9030DDRC

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