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    • N6473A OIF-CEI 4.0 Compliance Application for Infiniium Real-Time Oscilloscopes [Discontinued]

    N6473A OIF-CEI 4.0 Compliance Application for Infiniium Real-Time Oscilloscopes

    Product Status:
    Discontinued / Currently Supported
    Discontinued / Currently Supported
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    • Overview and Features
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    HIGHLIGHTS

    Comprehensive measurement and debug solution

    • Performs PAM4 and NRZ measurements as outlined in the OIF-CEI 4.0 specification
    • Makes more than 100 tests
    • Level-based (noise, linearity), eye-based (EW6, EH6), jitter, and return loss tests

    Flexible and extensible

    • Operates on the Keysight Z-Series real-time oscilloscopes
    • Automatic HTML report generation
    • Test all or selected parameters to compliance limits or custom limits

    Compatibility

    •  Z-Series real-time oscilloscopes

    Demand for increased network bandwidth in data centers continues to grow. Pulse Amplitude Modulation (PAM) is a multi-level signaling format that is enabling technology to help address this need.

    The Keysight N6473A OIF-CEI 4.0 Compliance Application for Infiniium Real-Time Oscilloscopes is designed to accurately and quickly characterize PAM4 and NRZ electrical signals and address PAM and NRZ measurement needs as outlined in the standard.

    Performing PAM4 and NRZ measurements as per requirements of developing industry standards can be challenging and difficult. You can save time and maximize the accuracy of your PAM4 measurements by using the Keysight N6473A OIF-CEI 4.0 Compliance Application with your Z-Series real-time oscilloscope. This tool will allow you to measure your Pulse Amplitude Modulation 4-Level (PAM4) and NRZ design according to the measurement requirements detailed in the OIF-CEI 4.0 standard.

    Performs a number OIF-CEI 56G clauses including CEI-56G-VSR, CEI-56G-MR and CEI-56G-LR with more than 100 PAM4 and NRZ tests including:

    • Jitter measurements to include Uncorrelated Unbounded Gaussian Jitter (UUJ), Bounded Uncorrelated Jitter (BUJ) and Even-Odd Jitter
    • Critical Eye measurements on all eyes including Eye levels, RMS level and Level Separation Mismatch Ratio
    • Output waveform measurements including Linear Fit Pulse Peak and Signal-to-Noise-and-Distortion Ratio (SNDR)
    • Differential and Common-Mode Output Return Loss measurements

    NOTE: This product has a June 1, 2020 end of life and is replaced by N109256CB
     

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