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    • N109256CA TX Test Automation Software Application for OIF-CEI 4.0 [Discontinued]

    N109256CA TX Test Automation Software Application for OIF-CEI 4.0

    Product Status:
    Discontinued / Currently Supported
    Discontinued / Currently Supported
    Technical Support
    Technical Support
    pdf Download Data Sheet
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    Replacement Product
    N109256CB Electrical TX Test Software for OIF-CEI-4.0
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    HIGHLIGHTS

    Comprehensive measurement and debug solution

    • Characterizes CEI-56G-VSR/MR/LR TX designs defined by OIF-CEI-4.0
    • Performs over 100 tests
    • Key measurements include jitter, eye linearity, SNDR, eye-opening (EW6, EH6), and return loss

    Flexible and extensible

    • Operate on an 86100D DCA-X oscilloscope, or on a PC connected to an N109x DCA-M via USB
    • Automatic HTML report generation
    • Test all or selected parameters to compliance limits or custom limits

    Compatibility

    • N1000A DCA-X Mainframe
    • 86100D DCA-X Mainframe
    • N109X DCA-M Oscilloscope
    • N107X Clock Recovery

    The Keysight N109256CA TX test application can be used with the N1000A/86100D DCA-X or N109X DCA-M Series oscilloscopes to quickly and accurately perform NRZ and PAM4 measurements according to:

    • CEI-56G-VSR (Reference OIF2014.277.08 NRZ, OIF-CEI-4.0 PAM4)
      • Section 15.3.2 Host to Module at TP1a, Table 15-1 (NRZ)
      • Section 15.3.3 Module to Host at TP4, Table 15-4 (NRZ)
      • Appendix 15.B.1.1 Host-to-Module at TP0a, Table 15.9 (NRZ)
      • Section 16.3.2 Host to Module at TP1a (Host Output), Table 16-1 (PAM4)
      • Section 16.3.3 Module to Host at TP4 (Module Output), Table 16-4 (PAM4)
      • Appendix 16.B.1.1 Host to Module at TP0a, Table 16.10 (PAM4)
    • CEI-56G-MR (Reference OIF-CEI-4.0)
      • Section 17.3.1, Table 17-2 and 17-3 (MR-PAM4)
    • CEI-56G-LR (Reference OIF-CEI-4.0)
      • Section 21.3.1, Tables 21-2, 21-3 (LR-PAM4)

    The N109256CA is an easy-to-use TX test application that:

    • Saves time in understanding details of standards
    • Reduces the time it takes to characterize your PAM4 and NRZ design from hours to minutes
    • Helps debug your device using custom configurations
    • Allows you to quickly generate HTML reports that summarize the performance of your device

    Key measurements include:

    • Jitter Measurements including UUGJ, BUJ, Even-Odd Jitter (EOJ)
    • Output Waveform measurements including Steady-State Voltage (Vf), Linear Fit Pulse Peak and Signal-to-Noise-and-Distortion (SNDR)
    • Transition Time
    • Eye Width (EW6) and Eye Height (EH), Far-end and Near-end
    • Return Loss

    For a comprehensive and up-to-date list of specific tests covered by the application, download and install the N109256CA.exe onto a PC (click the Trials and Licenses tab), and run the application in “Demo Mode”. No license (or hardware) is required to run the software application in “Demo Mode”.

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