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The DriveThru feature enables the test development software to test integrated circuits or connectors when there are no test points assigned between the resistor and the device.

HIGHLIGHTS

In many printed circuit board designs, pull-up and down resistors are added to bias the integrated circuit. The node between the resistor and the device usually does not have a test point. The DriveThru feature enables the test development software to test integrated circuits or connectors when there are no test points assigned between the resistor and the device.

When enabled, the development software will automatically select the test point across the resistor when executing VTEP or nanoVTEP tests on an integrated circuit.

Apart from resistors, series components such as inductors, jumpers, switches, fuses, and small capacitors are supported by this feature.

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