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E4874A Characterization Software Components

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Overview and Features
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HIGHLIGHTS

Automation of characterization measurements with the Keysight 81200
1 kbit/s to 660 Mbit/s
Selection of engineering templates and ActiveX graphic control components for VEE, Labview, C++ and Excel Vba
Simple integration and control of additional external instrument
Auto-adjust of the analyzers sampling point
Graphical results for shmoo plot, jitter and eye diagram measurements

- Automate your characterization measurements

You can use the Keysight E4874A Characterization software components to set up automated characterization tasks fast and easily. Using the examples, such as shmoo plots, jitter and eye diagram measurements, you can create your test function in the software environment that best suits you: Labview or HP VEE, C++ or even Excel spreadsheets with Visual Basic.

- Simplify the integration and control of other instruments

The E4874A simplifies the integration and control of other test instruments, such as power supplies, parametric measurement units or oscilloscopes (via GPIB, LAN or VXI interface). In addition the programming of your test setup is simplified with the Keysight 81200 plug-and-play drivers.

- What are the E4874A characterization software components?

The E4874A Characterization software components are examples that simplify the set up of measurements with parameter sweeps. The user can modify and extend the examples tailored to the needs of the measurement task. The E4874A consists of:

1. Templates, containing an input and measurement section, performing a dual parameter sweep

2. A graph control component, using the MS ActiveX interface.

For complete details, click on the E4874A Technical Specifications link.

Windows NT is a U.S. registered trademarks of Microsoft Corporation.

Automation of characterization measurements with the Keysight 81200
1 kbit/s to 660 Mbit/s
Selection of engineering templates and ActiveX graphic control components for VEE, Labview, C++ and Excel Vba
Simple integration and control of additional external instrument
Auto-adjust of the analyzers sampling point
Graphical results for shmoo plot, jitter and eye diagram measurements

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