Each episode of Life in the Fast Lanes features interviews with high-speed data experts:
• Explaining new data standards, such as USB4v2, PCIe 6.0, and IEEE/OIF 224 Gbps
• Exploring industry trends, from government mandates to transmitter and receiver design
• Solving physical layer design and test challenges using industry-leading oscilloscopes, VNAs, automation software, and BERTs.
Lesson 1 - USB4 Version 2.0
Jit Lim shares the history of the USB standard, discusses USB Type-C mandates, and identifies the biggest challenges developers face with the new USB Version 2.0 standard.
Lesson 2 - The Challenges of Migrating from NRZ to PAM
Mike Beyers discusses PAM's benefits over NRZ signaling, testing challenges, and key specs/tools for PAM measurements, including 12-edge jitter, equalization, and error correction.
Lesson 3 - Solving Tough High-Speed Digital Test Challenges
Chris Rehorn shares the differences between NRZ and PAM4, talks DDR4 and DDR5, reviews USB4v2 designs, and explores how the UXR oscilloscope addresses all these challenges.
Lesson 4 - Ethernet Market Trends & 200 Gb/s Test Challenges
Ben Miller discusses high speed data center’s importance and there data requirements and improvements.
Lesson 5 - Ethernet Network Testing at 800GE and 1.6T
John Calvin and Charles Seifert explore Ethernet network testing tools and procedures, as well as how forward error correction (FEC) is used in IEEE and OIF-CEI Ethernet standards.
How to Test USB Power Delivery Over the Type-C Connector
USB Type-C is a ubiquitous and powerful interface that supports smaller form factors, higher data rates, more power capabilities, and flexible connectivity with other protocols.