Sub-picometer resolution for validating tightly spaced optical channels

Keysight XP2-class wavelength meters provide fast, accurate, and traceable wavelength measurements of dense wavelength division multiplexing (DWDM) signals for calibrating tunable transmitter lasers. Featuring high resolution and repetition rate, our wavelength meters are designed to meet the stringent demands of R&D labs, manufacturing lines, and calibration environments where absolute wavelength accuracy is critical. With wide wavelength coverage and sub-picometer resolution, Keysight wavelength meters ensure compliance with International Telecommunication Union (ITU) grids, minimize drift-related errors, and accelerate tuning and validation tasks. Select the wavelength meter you need based on the wavelength range and absolute wavelength accuracy level you require. Choose one of our popular configurations or configure one specific to your application.

Sub-picometer accuracy

Achieve ultra-fine wavelength resolution with absolute accuracy down to ±0.2 ppm, ideal for tightly spaced ITU channel validation and fine spectral tuning.

Fast update rates

Real-time wavelength display and fast measurement speeds enable closed-loop laser tuning and high-throughput manufacturing workflows.

Broad wavelength coverage

Covers multiple optical wavelength ranges across C, L, and O bands to support diverse applications from optical communications to photonics.

Traceable calibration

Factory-calibrated to international standards with long-term stability and low drift to provide you confidence in every wavelength measurement.

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  • Wavelength range

    1270 nm to 1650 nm, 700 nm to 1650 nm

  • Absolute wavelength accuracy

    ± 0.2 ppm to ± 1 ppm

  • Measurement cycle time

    0.3 s to 0.6 s

  • Minimum resolvable line separation

    5 GHz to 15 GHz

  • Best power accuracy

    ± 0.5 dB to ± 0.6 dB

Frequently asked questions