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N5991 MIPI C-PHY 2.0 Receiver Conformance Test Automation Platform

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At a Glance

 

High-speed digital standards are quickly evolving to keep pace with emerging technologies such as 5G, Internet of Things (IoT), artificial intelligence (AI), virtual reality (VR), and autonomous vehicles.

 

Each generational change introduces new test challenges for your digital designs. You are required to test your high-speed digital designs across all product development stages, with design and simulation, analysis, debug, and compliance test. Followed by system implementation, the latest N5991 software solution anticipates test challenges, optimizes performance, and accelerates time-to-market of your highspeed computing interfaces, data center connections, and consumer electronics.

 

The Keysight N5991 software solution comprises the following features:

 

• Support for High-Speed digital standards such as MIPI® C-PHYSM, USB, PCIe, CCIX, SAS and HDMI. Other standards will be continuously added with the requirements for higher data speed testing

• Guided setup with automated fast stress signal calibrations and compliance measurement functions

• Modern interface with enhanced functionalities

• System modularity that lets you enable just the required functionality

• Test reports generated in HTML / Excel formats

• Link training suites and frame generator applications that include features for debugging of DUTs

• Node-locked and transportable licenses plus annual service, support and update licenses

• Characterization mode for in-depth testing

 

Transform your instruments into a solution

 

An efficient test strategy is a proven competitive advantage. The Keysight N5991 test automation software platform is the successor to the well-known industry standard N5990A test automation software platform. While it follows the same concept of combining the performance of your instruments with the convenience of your PC, the latest N5991 test automation software platform provides unprecedented test integration, high throughput, and ease-of-use for a wide range of stimulus and response systems. This approach provides a level of control that transforms a collection of instruments into a universal, user friendly and highly productive test solution.

 

Fast and reliable testing

 

The comprehensive N5991 software platform increases test speed, reduces test costs, and ensures greater thoroughness than manual electrical testing. If, for example, the C-PHY standard is tested using the N5991 software, you can test the receivers of products that use the MIPI CSI or DSI standards, whether they are production-ready prototypes, development boards, or chipsets.

 

Standardize your tests

 

The N5991 receiver-test options provide dedicated receiver conformance tests for popular and emerging digital buses. You can choose compliance mode for fast certification testing, or characterization mode for in-depth analysis. The Receiver Test Automation Platform’s compliance testing capabilities have been repeatedly proven at interoperability workshops or “plug-fests”.

 

The N5991 platform has been built upon the success of previous generations to deliver significant gains in productivity. Like its predecessor (the N5990A software), the interface for the new system has been designed using a common framework, which makes it easy to test multiple buses, such as MIPI C-PHY, USB, PCI Express, CCIX, SAS and more. It delivers additional gains by using HTML or Excel formats for reporting results. The N5991 software architecture is based on C# code and Microsoft .NET, which, in conjunction with on-the-fly amplitude and jitter control supported by many Keysight instruments, ensures fast interaction, calibration, and test execution for the highest possible throughput.

 

Test selection and test results

 

The test automation software platform lets you select tests from an intuitive tree structure with multiple levels of detail. Select the tests you want to run, as well as the number of their repetitions. Test results are provided in HTML or Microsoft Excel format. Measuring results are reported in parameter tables and graphically in curves

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