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segmentation:campaign/Bench,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentation:business-unit/EISG,keysight:product-lines/gm,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generators,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:models/fg/fg33532asegmentation:campaign/Bench,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentation:business-unit/EISG,keysight:product-lines/gm,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generators,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:models/fg/fg33532asegmentation:campaign/Bench,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentation:business-unit/EISG,keysight:product-lines/gm,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generators,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:models/fg/fg33532asegmentation:campaign/Bench,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentation:business-unit/EISG,keysight:product-lines/gm,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generators,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:models/fg/fg33532asegmentation:campaign/Bench,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentation:business-unit/EISG,keysight:product-lines/gm,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generators,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:models/fg/fg33532asegmentation:campaign/Bench,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentation:business-unit/EISG,keysight:product-lines/gm,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generators,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:models/fg/fg33532asegmentation:campaign/Bench,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentation:business-unit/EISG,keysight:product-lines/gm,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generators,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:models/fg/fg33532asegmentation:campaign/Bench,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentation:business-unit/EISG,keysight:product-lines/gm,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generators,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:models/fg/fg33532asegmentation:campaign/Bench,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentation:business-unit/EISG,keysight:product-lines/gm,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generators,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:models/fg/fg33532asegmentation:campaign/Bench,segmentation:product-category/DMMs_DAQs_Function_Generators,segment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Come generare, acquisire e verificare forme d'onda arbitrarie
Generare una forma d'onda arbitraria personalizzata, configurare un multimetro digitale per l'acquisizione con trigger, acquisire l'evento della forma d'onda e verificare il risultato direttamente sul display dello strumento. Questo flusso di lavoro da banco combina la generazione di forme d'onda arbitrarie, l'acquisizione delle forme d'onda, l'acquisizione con trigger e la verifica delle forme d'onda in un test funzionale ripetibile.
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