Mini In-Circuit Tester
Application Notes
Keysight Mini In-Circuit Tester (ICT) is the first modular in-circuit tester with standard communication protocol for instruments (SCPI) command support. It can be integrated into different applications to provide in-circuit test coverage with device or pin-level defect information. In this article, we are going to discuss the SCPI commands and the potential use models.
Overview
Normally multiple test strategies are used in a manufacturing line, such as automatic optical inspection (AOI), in-circuit test (ICT), and functional test. Different test strategies offer different defect information. For example, AOI systems normally provide device-level defect information in graphical view, ICT reports device-level defects with failed information about the functionality of the device while functional test provides functional failures, such as “display failure.” Functional test results provide a go/no-go for the product, but repairing boards based on functional test results is difficult due to lack of details of the reported failures. A combination of functional test and ICT will provide a viable way to improve the level of details which functional test alone fails to provide. The Keysight Mini ICT is designed for providing detailed failure information when needed.