How to Perform On-Wafer Parametric Measurements

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Parameter Analyzers
+ Parameter Analyzers
Parameter Analyzers
+ Parameter Analyzers

Perform On-Wafer Parametric Measurements in a Teaching Lab

Bridging semiconductor device theory with industry-ready measurement skills requires a laboratory environment where students can directly perform device characterization using professional test equipment. In semiconductor engineering courses, students must learn to probe devices on wafer, measure electrical characteristics such as MOSFET Id–Vd and Id–Vg curves, extract key parameters including threshold voltage, and analyze device behavior under different biasing conditions. These hands-on experiments allow students to understand the relationship between semiconductor physics and real electrical performance.

Achieving this learning outcome requires a teaching platform that integrates industry-standard measurement instruments, structured laboratory modules, and intuitive analysis software. A parametric test and on-wafer measurement teaching lab enables students to configure semiconductor parameter analyzers, perform precision I-V and C-V measurements, and investigate low-current and transient behaviors of semiconductor devices. By combining real measurement workflows with guided experimentation, universities can deliver scalable semiconductor education while preparing students with the practical device characterization skills required in modern semiconductor R&D and manufacturing environments.

On-Wafer Parametric Measurements in a Teaching Lab Solution

Bridging semiconductor theory and practical device characterization requires a laboratory environment that allows students to perform precise electrical measurements and directly observe device behavior at the wafer level. The Keysight Parametric Test and On-Wafer Measurement Teaching Lab Solution integrates the B1500A Semiconductor Device Parameter Analyzer, industry-standard probe stations, and EasyEXPERT software to enable hands-on semiconductor device characterization, including MOSFET I-V measurements, threshold voltage extraction, C-V analysis, and ultra-low current detection. The structured lab modules and industry-standard instrumentation, the platform provides a ready-to-deploy teaching environment that enables accurate on-wafer measurements, streamlined experiment execution, and practical learning workflows, helping universities train students with industry-relevant semiconductor measurement skills.
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Explore Products in Our On-Wafer Parametric Measurements

  • B1500A Semiconductor Device Parameter Analyzer / Semiconductor Characterization System Mainframe

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  • UU102LAB Semiconductor Teaching Lab Solution : Parametric Test and On-Wafer Measurement

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