Clock data recovery (CDR) mode in 45Gb/s DeMUX module
Intuitive Windows 2000/ NT® -based user software
The Keysight ParBERT 81250 40 Gb/s solutions are integrated bit error ratio (BER) measurement systems ideal for testing 16:1 and 4:1 OC-768 MUX (multiplexing), DeMUX (de-multiplexing) and serial devices. Depending on the configuration, the system generates and analyzes serial data streams at 38 up to 45 Gb/s, at the associated 1/2, 1/4, 1/8 and 1/16 subranges and parallel data streams at up to 10.8 Gb/s. Generate standard PRBS data up to 2^31-1 and on the parallel lines pseudo random word sequences (PRWS). Analyze BER with user-defined or PRBS data. The system hardware is VXI-based and the user software is Windows 2000 / NT®-based
The Keysight ParBERT 81250 40G electrical/optical Parallel Bit Error Ratio Tester systems are ideal for testing the parallel and serial sides of OC-768 either optical or electrical allowing semiconductor, component and equipment manufacturers to accelerate time to market.
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