Choose a country or area to see content specific to your location
Enable browser cookies for improved site capabilities and performance.
Toggle Menu
-
PRODUCTS AND SERVICES
-
Oscilloscopes
-
Analyzers
- Spectrum Analyzers (Signal Analyzers)
- Network Analyzers
- Logic Analyzers
- Protocol Analyzers and Exercisers
- Bit Error Ratio Testers
- Noise Figure Analyzers and Noise Sources
- High-Speed Digitizers and Multichannel DAQ Solutions
- AC Power Analyzers
- DC Power Analyzers
- Materials Test Equipment
- Device Current Waveform Analyzers
- Parameter / Device Analyzers and Curve Tracers
-
Meters
-
Generators, Sources, and Power Supplies
-
Software
-
Wireless
-
Modular Instruments
-
Network Test and Security
-
Network Visibility
-
Services
-
Additional Products
- All Products, Software, Services
-
-
Solutions
-
Explore by Use Case
Explore by Industry
- All Solutions
- Insights
- Resources
- Buy
- Support
What are you looking for?
Suggested searches
No product matches found - System Exception
Matched content

Application Notes
Optimize Power Source Integrity Under Large Load Transients
Show Description
Today’s integrated circuits are operating faster than ever. The increased operating speed can lead to highly dynamic power demand from the power supply, which poses a challenge during testing when you source power using programmable power supplies. The high-speed current waveforms can lead to voltage drops at the integrated circuit. If it is severe enough, the voltage drop can reset the microprocessor or cause anomalies in your test results. This application note explains why this voltage drop occurs and offers several ways to achieve the lowest possible voltage drop by selecting optimal load leads and power supplies and using local bypassing.
Thank you!
- © Keysight Technologies 2000–2023
- Privacy
- Sitemap
- Terms
- Trademark Acknowledgements
- Feedback