Improve your i3070 in-circuit test system's test performance with advanced software that increases test throughput and coverage. Expand your testing capabilities and optimize your manufacturing process with these powerful tools.

Our software licenses include the following:

  • Advanced Throughput Multiplier, which can save up to 50% of test time.
  • Native testing software licenses for boundary scan-related tests that cover IEEE 1149.1 and 1149.6 standards.
  • Keysight's Cover Extend Technology (CET) for extending test coverage to non-boundary scan devices using nanoVTEP and CET Signal Conditioner Card.
  • Silicon Nails feature uses boundary scan device drivers and receivers to test non-boundary scan devices connected to the chain flashing test capability through Flash ISP and PLD ISP features.
  • DGN Advanced Reporting feature for diagnostic testing.
  • Yearly software updates for test development and runtime to keep your testing up-to-date.

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