Medalist i3070 In-Circuit Test Platform

Introduction 

The Keysight Technologies’, Inc. Medalist i3070 is the next generation In-Circuit Test System (ICT) that provides significant return of investment with unparalleled test coverage and robustness. Our solution enables up to 20% more output while boosting coverage by expanding on our award winning vectorless test innovations, extending the performance of the world’s most proven In-Circuit Test Platform. The Keysight Medalist 3070 is the most flexible and stable In-Circuit Test System in the world. The Keysight Medalist i5000 is the fastest-to-learn, easiest-to-deploy ICT system in the world. Now you can have the best of both worlds with the Keysight Medalist i3070 ICT system. The trusted and robust system that you are familiar with is now also simple-to-use. The Medalist i3070 combines all the features of a state-of-the-art Keysight Medalist 3070 with the advanced architecture and streamlined usability of the Medalist i5000. You get an intuitive point-and-click interface, automated test debug and optimization tools, and a host of other features to accelerate every aspect of test programming and deployment. 

Accelerate success with the Medalist i3070 

For electronics manufacturers around the world, the Medalist i3070 is the fastest, easiest way to bring the power of in-circuit test to the production line. 

Simple operation, faster deployment 

A menu-driven graphical user interface (GUI) provides easy, menu-driven access to the underlying power of the Medalist i3070. A suite of automation tools further accelerate learning curves, so tests get into production faster. 

High throughput, faster payback

The Medalist i3070 provides a 10 to 50 percent improvement in analog test throughput compared to the legacy Keysight Medalist 3070. And with its new affordable pricing, the Medalist i3070 allows you to trim capital spending while getting a faster return on your test investment. 

Flexible architecture, fast configuration

The Medalist i3070 features one-, two- and four-module configurations, so you can match your test system to your exact production and budget requirements. 

Compatible platform, faster migration

Existing 3070 and i5000 fixtures and programs can be run on the Medalist i3070 with no changes. Your existing investment in test is fully leveraged by the Medalist i3070, so you don’t lose time or money when you make the move.

Key Features 

Every aspect of the Keysight Medalist i3070 – from its push-button, menu-driven interface to its flexible architecture – is designed to get printed circuit boards and assemblies into production and out the door faster. It’s a powerful asset for helping electronics manufacturers operate profitably in an era of shrinking budgets, scarce resources, and tight schedules. 

TUser-friendly GUI 

Even someone with limited ICT experience can begin using the Medalist i3070 with little or no training. Programming happens with a mouse rather than a keyboard, so there is no need to type in commands or deal with command syntax or spelling. The Medalist i3070 eliminates the barrier between test system and operator, allowing quality work to be done quickly, and helping engineers reach a high level of productivity with a very short learning curve. 

VTEP v2.0 

Medalist VTEP v2.0 is a suite of vectorless test1 solutions which encompasses the new Network Parameter Measurement technology as well as the original Medalist VTEP technology and the award-winning Medalist iVTEP. Bringing all these solutions together into VTEP v2.0 means having the best vectorless test in your hands. An industry first, Network Parameter Measurement technology detects defects on power and ground pins while iVTEP focuses on ultra low value measurement of signal pins (< 5fF). Furthermore, having the original Medalist VTEP as its core means enabling measurements which are 4X more sensitive and 5X better in standard deviation. As technology advances with shrinking packages and faster signaling speeds, VTEP v2.0 is a necessity to meet the challenges of today and beyond.

AutoDebug 

With the Medalist i3070, unpowered passive analog components can be debugged with the click of a button, so even someone with limited ICT experience can perform a complete analog test debug in a matter of hours. AutoDebug fine-tunes tests so boards pass reliably in production. It runs the selected test, captures measurement data, evaluates the data, adds or deletes measurement options, and compiles the tests. You set the rules, and AutoDebug does the rest.

AutoOptimizer 

Medalist i3070 tests can be optimized with the click of a button, reducing test time by 10 to 50 percent per test. AutoOptimizer checks to see that tests are stable, and cleans up any conflicts in code to get a clean, smooth-running test. It’s great for cleaning up programs that have been modified during production runs, allowing tests to once again run fast, clean and reliably.

Tester-per-pin Architecture 

The Medalist i3070 supports both muxed or unmuxed pin cards. When configured with unmuxed pin cards, the Medalist i3070’s innovative system architecture simplifies programming and fixture development with complete per-pin programmability. 

Cross-platform Compatibility 

The Medalist i3070 is forward and backward compatible with other Keysight ICT systems. Programs developed on the Keysight 3070 (5.30PC and later) or the Medalist i5000 will run on the Medalist i3070 with no changes. Older programs may require a minor re-compile using the Medalist i3070’s built-in program conversion tool. Fixtures will work on the Medalist i3070 with no rewiring. This high degree of compatibility with the Medalist i3070 provides an open door to future technologies while preserving the investment you make in test. 

Transportable, Repeatable 

Stable Tests. Medalist i3070 tests can be written in one location and moved to other sites, lines, or Keysight systems with no impact on test stability or measurement accuracy. With the Medalist i3070 you have a fast, low-cost way to leverage your programming investment and keep programming costs down. 

Lower Entry Cost 

By leveraging technologies from earlier generations of Keysight ICT systems, the Medalist i3070 carries the best attributes forward while driving costs out of the platform. You get all the power and usability at a lower cost than earlier-generation systems from Keysight.