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6G Sub-Terahertz R&D Testbed

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Key Features & Specifications


  • 6G Waveform Prototyping and Testing
  • 6G Sub-Terahertz R&D Hardware Testing
  • 6G Wideband D-band (110-170 GHz) and G-band (140-220 GHz) Signal Generation and Analysis


This 6G sub-terahertz R&D test bed is flexible and scalable to address a multitude of frequency bands, frequency bandwidths, and waveform types. This flexibility allows you to tackle emerging 6G R&D testing challenges with up to 10 GHz of bandwidth at D-band (110-170 GHz) and G-band (140-220 GHz).

A multichannel Keysight M8195A 65 GSa/s arbitrary waveform generator (AWG) generates wideband and extreme-band width modulated IF signals. Virginia Diodes Inc. (VDI) compact D- or G-band upconverters convert the wideband IF from the M8195A to the desired sub-terahertz frequency band. On the receive side, the signal is down-converted with a compact VDI downconverter to an IF and digitized with a Keysight UXR Multichannel High-performance Oscilloscope or a Keysight M8131A multichannel AXIe streaming digitizer. A Keysight E8267D PSG Vector Signal Generator with option UNY provides a low-phase-noise LO for the VDI converters.

This R&D testbed offers flexibility and scalability in prototyping various types of waveforms and operating in different frequency bands. It is also scalable for multiple channels for MIMO research.