Mehr erfahren
segmentation:campaign/IC_Semi_Mfg,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Optical_Modulation_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/3e,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductorsegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Optical_Modulation_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/3e,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductorsegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Optical_Modulation_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/3e,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductorsegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Optical_Modulation_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/3e,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductorsegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Optical_Modulation_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/3e,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductorsegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Optical_Modulation_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/3e,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductorsegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Optical_Modulation_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/3e,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductorsegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Optical_Modulation_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/3e,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductorsegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Optical_Modulation_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/3e,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductorsegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Optical_Modulation_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/3e,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor
Wie man Leistungsmessungen auf Wafer-Ebene in der Siliziumphotonik automatisiert
Automatisierte optische Leistungsmessungen auf Wafer-Ebene zur Charakterisierung von Siliziumphotonik-Bauelementen mittels abstimmbarer Laser und programmierbarer Dämpfungsglieder zur Messung von Verlust, Empfindlichkeit und Sättigung über Wafer hinweg mit hoher Wiederholgenauigkeit.
Mehr erfahren