Solutions for Active Device Test : Using Modern VNAs to Automate Traditional Multi-instrument RF Test Systems
Applikationsberichte
Introduction
Overview
Designing test systems is a complex task, especially when those systems are intended to test active devices used in the aerospace & defense and wireless communications arenas. Here, stringent requirements and continually changing standards stress an already challenging test process. Traditionally, multi-instrument RF test systems have been created to meet these challenges. Along with the test hardware, test system designers typically employ software to automate the test process. Automation provides increased speed and therefore higher test throughput, convenience in terms of data collection and reduced operator error, and synchronized measurements for triggering between multiple instruments and/or control of the device under test (DUT).