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X-Series Measurement Applications

1xEV-DO Measurement Application, Traditional UI

This bundle is part of PathWave X-Series Measurement Applications

Installs on: Instrument


Key Features

  • 30-Day Free Trial for X-Series Measurement Applications
  • Complies with 3GPP2 standard of physical layer specifications C.S0024 (Rel.0, Rev. A, and Rev. B) including Subtype 0/1/2/3  
  • Forward link measurements: composite EVM and rho, CDP, CDE, I/Q chip errors, code domain, channel power, power vs. time, ACP, SEM, and more
  • Reverse link measurements: composite EVM and rho, CDP, CDE, I/Q chip errors, code domain, channel power, ACP, SEM, and more
  • Support auto-detection for data channels QPSK, 8PSK, 16QAM, and 64QAM
  • For reverse link, supports channel types including Pilot, RRI, data, ACK, DRC, DSC, and auxiliary pilot
  • Performance: Composite EVM: up to 1.0%; ACLR: up to -83 (-88 dBc typical); Power accuracy: up to ±0.23 dB (at 95th percentile)
  • Support traditional user interface and SCPI remote interface programming
  • KeysightCare software support subscription included

This Bundle Includes

  • N9076EM0D X-Series measurement application license for 1x-EVDO RF conformance measurements with traditional UI
  • 1x-EVDO measurement application software subscription and support (12-month)

System Requirements

Instrument Compatibility

This Bundle Is Part of…

PathWave X-Series Measurement Applications — The industry's broadest offering of measurement applications for benchtop and modular signal analyzers for cellular communications, wireless connectivity, aerospace/defense, and general purpose.


Learn more: PathWave X-Series Measurement Applications

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US$ 4,348