Here's the page we think you wanted.
See search results instead:
Choose a country or area to see content specific to your location
Enable browser cookies for improved site capabilities and performance.
Toggle Menu
-
PRODUCTS AND SERVICES
-
Oscilloscopes
-
Analyzers
- Spectrum Analyzers (Signal Analyzers)
- Network Analyzers
- Logic Analyzers
- Protocol Analyzers and Exercisers
- Bit Error Ratio Testers
- Noise Figure Analyzers and Noise Sources
- High-Speed Digitizers and Multichannel DAQ Solutions
- AC Power Analyzers
- DC Power Analyzers
- Materials Test Equipment
- Device Current Waveform Analyzers
- Parameter / Device Analyzers and Curve Tracers
-
Meters
-
Generators, Sources, and Power Supplies
-
Software
-
Wireless
-
Modular Instruments
-
Network Test and Security
-
Network Visibility
-
Services
-
Additional Products
- All Products, Software, Services
-
-
Solutions
-
Explore by Use Case
Explore by Industry
- All Solutions
- Insights
- Resources
- Buy
- Support
What are you looking for?
Suggested searches
No product matches found - System Exception
Matched content
- Home
- Products and Services
- ...
- Instrument Workflow Software
- PathWave X-Series Measurement Applications
- N9077EM2E WLAN 802.11be Measurement Application, Multi-Touch UI
N9077EM2E WLAN 802.11be Measurement Application, Multi-Touch UI
Perform WLAN 802.11be one-button measurements defined by IEEE 802.11 standard
Sold by: Keysight Online Sales
Starting from
Perform WLAN 802.11be one-button measurements defined by IEEE 802.11 standard.
- 30-Day Free Trial for X-Series Measurement Applications
- Support 802.11be EHT 20/40/80/160/320 MHz signals to perform power, spectrum, and modulation measurements
- Support 802.11be MU PPDU compressed mode and preamble puncturing modulation analysis with modulation type up to 4096 QAM
- One-button measurements with pass/fail per the test limit definition
- Swept measurement with time-gated support: Channel Power, SEM, OBW, Monitor Spectrum, Spurious emission
- IQ measurements: IQ waveform, Power vs. Time, CCDF, spectrum flatness, and modulation analysis
- Modulation analysis with multiple result views: constellation diagram, EVM vs. symbol, EVM vs. subcarrier, Power vs. Symbol, Demod Bits, Numeric results, Burst and Sig Info (U-SIG, OFDM L-SIG), EHT-SIG (User Info, Common Field), Preamble Freq Error, IQ Impairment (Gain Imbalance and Quadrature Skew), User Information Summary
- Support cross-correlated EVM (ccEVM) to extend the dynamic range of a receiver for best EVM performance
- Keysight supports tiered X-app models with N-models for UXA/PXA/PXE, E-models for MXA/EXA/MXE/VXT. The higher tiered X-app models can run at the lower platforms, which means N-models can run on all platforms, and E-models can only run on MXA/EXA/MXE/VXT.
Extend the Capabilities of Your Product
Want help or have questions?
- © Keysight Technologies 2000–2023
- Privacy
- Sitemap
- Terms
- Trademark Acknowledgements
- Feedback