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No product matches found - System Exception
Parametric Photonic Test
High-Volume PIC Test
New polarization alignment and stabilized polarization sweeps are especially valuable for on-wafer and PIC testing, including probe alignment. Learn about Keysight’s turnkey solution for polarization optimization based on the Mueller Matrix technique to greatly reduce measurement and start-up times. We will demonstrate how to make insertion loss (IL), polarization-dependent loss (PDL), transverse electric(TE)/transverse magnetic (TM), and responsivity measurements in a single sweep without polarization alignment.
Solution Capabilities:
- Fast single-sweep PDL
- TE/TM and pol-alignment
- Scalable: λ-bands, ports
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