How to Generate Impaired Signals for Device Test

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Pulse Generator
+ Pulse Generator
Pulse Generator
+ Pulse Generator

Generate Controlled Impaired Signals

Impaired signal testing becomes difficult when a device only fails under specific timing, level, edge, noise, or jitter conditions. A full system signal path can make those conditions hard to isolate because the upstream source, interconnect, and device input may all contribute to the observed behavior.

The test starts with a known input waveform and then applies one controlled impairment at a time to the device input. Engineers can vary noise, jitter, voltage level, edge timing, pulse behavior, or waveform shape while monitoring the device response to determine which signal condition triggers the failure.

Impaired Signal Generation Solution

Impaired signal testing requires generating the expected input stimulus and then adjusting timing, levels, edges, noise, or jitter to create nominal and worst-case operating conditions. This solution uses a pulse generator to create pulse, pattern, function, arbitrary, and noise-based test signals from one stimulus platform. Engineers can apply controlled jitter injection, generate noisy waveforms, and configure signal parameters for baseband, high-speed serial, and signal-integrity test scenarios. The setup supports repeatable debug by recreating the same impaired waveform during functional validation.
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See Block Diagram of Impaired Signal Generation Solution

Block Diagram of Impaired Signal Generation Solution

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