The Advanced Design System (ADS) Statistical Design Package provides designers with Optimization, Sensitivity Analysis, Yield, Yield Optimization (also known as Design Centering), Design of Experiments (DOE), and Yield Sensitivity Histograms. These tools combine to provide the designer with added design insight, and help to eliminate manufacturing process variation surprises, and maximize product yield.

Powerful data display commands enable the creation of many useful statistical plots and histograms.

Product Highlights

  • Automatic normalization of the Sensitivity analysis output. The output sensitivities of different types of selected components in a design can be normalized with respect to each other. This allows for accurate and instantaneous determination of the elements sensitivities on a design that contains various types of elements with different ranges of values such as Kohm, picofarad, micro meter, etc.
  • Final Analysis parameter enables the user to have another analysis run after an optimization run is finished. This convenient feature allows easy analysis sequencing after circuit optimization is complete
  • Analyzes and optimizes manufacturing yield prior to production
  • Enables designers to compensate for unavoidable component variations
  • Provides designers with a clear insight on the robustness of their designs and identify Red-X components that must be controlled for better production yield
  • Accommodates post-production tuning by analyzing and predicting production yields for designs that employ tunable elements
  • Offers powerful data display capabilities for the creation of easily viewed statistical yield plots, and sensitivity histograms, with post-processing analysis and automatic update
  • Offers an Enhanced Optimization Output Controller that allows designers to easily create and optimize complex circuits by sweeping or programming the design optimization steps
  • Includes Sensitivity analysis and a full Design of Experiment (DOE) package, with all supporting plots, allowing designers to obtain complete design insight
  • Allows designers to perform Mismatch Models and Correlation Analysis for any kind of distribution, including Log Normal distribution, which is heavily used in RFIC design.

The Statistical Design Package provides a solution for any designer faced with the challenge of designing products for efficient production. For low volume production, this product ensures product robustness and reliability. In high volume production applications it will help increase yields and reduce costs.

This package provides designers with a new design process which takes advantage of automated Optimization, Yield analysis, Yield Optimization (also known as Design Centering), Sensitivity analysis, and the many other advanced statistical tools described below.

The Statistical Design Package is integrated into the W2200 ADS Core Environment. Learn more about ADS Core.