FITS-8CH Chassis — Advanced Option

Advanced Option for the Functional Interconnect Test Solutions GUI for the FITS-8CH chassis. Adds FEC error correction performance measurement and interconnect lane tuning capabilities to the GUI for the FITS-8CH chassis.

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  • Interface

    Auto-lane tuning with Keysight DCA

  • Number of channels

    Independent 8 Tx and 8 Rx

  • FEC

    FEC Monitoring 

  • Lane Speeds

    212.5 Gb/s

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Highlights

  • High-Speed Multi-Channel Testing: (8) independent transmit and (8) independent receive differential channels supporting 53Gb/s, 106Gb/s, and 212.5Gb/s PAM4 signaling speeds. FITS-8CH can simultaneously measure real-time BER performance on all (8) transmit and (8) receive channels.
  • Versatility Across Development and Manufacturing Applications: FITS-8CH is suitable for a wide range of high-speed interconnects and can be used for error performance validation in applications such as:
    • Product development and QA for pre-production fully assembled interconnects.
    • Manufacturing for sub-assembly mechanical alignment, temperature test, in-line, near-line, and end-of-line error performance validation applications.
    • FITS-8CH can connect to your 1.85mm RF connector fixture or to standard Module Compliance Boards with module controls over a GPIO interface. GPIO cable is included with chassis.
  • Advanced Optical and Electrical Interconnect Validation: Suitable for a wide range of high-speed interconnect test applications, including 1.6T, 800GE, and 400GE interconnect standards. Media types are fully retimed optical transceivers (FRO), Active Optical Cables (AOC), and Active Electrical Cables (AEC). Other interconnect types may be supported on 106G and 53G lanes. Please consult your Keysight representative.
  • Selection of channel voltage options for different applications: High Drive channels and Chip-to-Module channels are available.
    • High Drive channels are for maximum voltage levels for applications with interconnects that require signals at greater than 1Vpp signal.
    • Chip-to-Module channels for testing at industry standard Ethernet signal levels up to 1Vp-p.
  • Performance Under Challenging Conditions: Designed to deliver excellent signal integrity, ensuring that even under the most difficult signaling conditions, accurate BER at all supported channels speeds, and FEC symbol error correction analysis and margin assessment for the 212Gb/s channel speed are achieved.