World Leading High-Accurate Dk/Df Measurement System for Film, Powder etc., 1GHz - 10GHz
Flyers
High accuracy
Capable of measuring Ultra-thin films, Powders
KEYCOM’s high precision perturbation method enables you to measure dielectric constant (permittivity, εr) and dielectric loss tangent (tan δ) of such specimens as multi-layered structure, ultra-thin film or ferroelectric materials in the microwave region.
KEYCOM refined the conventional perturbation method that was JIS-standardized in 1992 (JISC2565) by closing the hole into which the specimen is inserted with metal, and the new method is also compliant with ASTMD2520.
Standardization
ASTMD2520, (JISC2565)
Measurable samples
－Powders
－ Ultra-thin films
－ multi-layer film
－ solids
－ sheets
－ liquids (oils etc.)
Features
－ High accuracy : εr' accuracy ±1%, tan δ accuracy ±3%. (depending on VNA).
－ Capable of measuring Ultrathin films (less than 0.1μm in thickness), multi-layer film
－ Also ideal for solids, sheets, powders, liquids (oils, etc.)
－ User-friendly operability.
－ Measurement frequency range : 1GHz - 10GHz.